Inventor
IKEJIRI HIDEO
JP3 patents
Patents
3 patentsUS7847632B2Dec 7, 2010
Short-circuit detecting circuit
OKI SEMICONDUCTOR CO LTD3 citations54
US7724024B2May 25, 2010
Semiconductor device with its test time reduced and a test method therefor
OKI SEMICONDUCTOR CO LTD0 citations46
US7564265B2Jul 21, 2009
Semiconductor device with its test time reduced and a test method therefor
OKI SEMICONDUCTOR CO LTD1 citations46