Inventor
FEELEY PETER SEAN
US39 patents
⚠️ This page may combine multiple inventors who share the name “FEELEY PETER SEAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
36 patentsUS10347344B2Jul 9, 2019
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC61 citations98
US7770079B2Aug 3, 2010
Error scanning in flash memory
MICRON TECHNOLOGY INC26 citations92
US10365854B1Jul 30, 2019
Tracking data temperatures of logical block addresses
MICRON TECHNOLOGY INC14 citations86
US10777284B2Sep 15, 2020
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC4 citations84
US10691377B2Jun 23, 2020
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC6 citations84
US10679704B2Jun 9, 2020
NAND temperature data management
MICRON TECHNOLOGY INC4 citations84
US10586602B2Mar 10, 2020
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC6 citations84
US10354732B2Jul 16, 2019
NAND temperature data management
MICRON TECHNOLOGY INC5 citations84
US9208833B2Dec 8, 2015
Sequential memory operation without deactivating access line signals
MICRON TECHNOLOGY INC11 citations84
US9093152B2Jul 28, 2015
Multiple data line memory and methods
MICRON TECHNOLOGY INC8 citations84
US8356216B2Jan 15, 2013
Error scanning in flash memory
MICRON TECHNOLOGY INC11 citations84
US11709633B2Jul 25, 2023
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC2 citations73
US11269553B2Mar 8, 2022
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC3 citations73
US11075163B2Jul 27, 2021
Vertical NAND string multiple data line memory
MICRON TECHNOLOGY INC3 citations73
US11043278B2Jun 22, 2021
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC2 citations73
US11037630B2Jun 15, 2021
NAND temperature data management
MICRON TECHNOLOGY INC2 citations73
US10923163B2Feb 16, 2021
Sequential memory operation without deactivating access line signals
MICRON TECHNOLOGY INC3 citations73
US10915444B2Feb 9, 2021
Garbage collection candidate selection using block overwrite rate
MICRON TECHNOLOGY INC3 citations73
US10579307B2Mar 3, 2020
Correcting power loss in NAND memory devices
MICRON TECHNOLOGY INC2 citations73
US10573357B2Feb 25, 2020
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US10497406B2Dec 3, 2019
Sequential memory operation without deactivating access line signals
MICRON TECHNOLOGY INC2 citations73
US10446197B2Oct 15, 2019
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US10936392B2Mar 2, 2021
Read window size
MICRON TECHNOLOGY INC3 citations72
US10430116B2Oct 1, 2019
Correcting power loss in NAND memory devices
MICRON TECHNOLOGY INC2 citations72
US11829290B2Nov 28, 2023
Garbage collection candidate selection using block overwrite rate
MICRON TECHNOLOGY INC1 citations63
US11670381B2Jun 6, 2023
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC0 citations63
US11626162B2Apr 11, 2023
Partial block memory operations
MICRON TECHNOLOGY INC0 citations63
US11355166B2Jun 7, 2022
Sequential memory operation without deactivating access line signals
MICRON TECHNOLOGY INC0 citations63
US11068197B2Jul 20, 2021
Tracking data temperatures of logical block addresses
MICRON TECHNOLOGY INC0 citations63
US8713385B2Apr 29, 2014
Error scanning in flash memory
MICRON TECHNOLOGY INC3 citations63
US11755472B2Sep 12, 2023
Periodic flush in memory component that is using greedy garbage collection
MICRON TECHNOLOGY INC0 citations62
US11610632B2Mar 21, 2023
NAND temperature data management
MICRON TECHNOLOGY INC0 citations62
US11231982B2Jan 25, 2022
Read window size
MICRON TECHNOLOGY INC0 citations62
US11106577B2Aug 31, 2021
Periodic flush in memory component that is using greedy garbage collection
MICRON TECHNOLOGY INC1 citations62
US11056156B2Jul 6, 2021
Optimized scan interval
MICRON TECHNOLOGY INC0 citations62
US11403228B2Aug 2, 2022
Memory device page program sequence
MICRON TECHNOLOGY INC0 citations51