Inventor
SAINO TAKAHIRO
JP4 patents
Patents
4 patentsUS10908173B2Feb 2, 2021
Sample measurement apparatus and method of measuring samples
SYSMEX CORP10 citations83
US10234364B2Mar 19, 2019
Sample processing apparatus and rack
SYSMEX CORP4 citations71
US9733161B2Aug 15, 2017
Sample processing apparatus and rack
SYSMEX CORP5 citations71
US12196683B2Jan 14, 2025
Method for notifying sample analyzer status and sample analysis system
SYSMEX CORP1 citations55