Inventor
DOH JI-SEONG
KR4 patents
Patents
4 patentsUS7617065B2Nov 10, 2009
Methodology for estimating statistical distribution characteristics of physical parameters of semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations61
US8356271B2Jan 15, 2013
Layout testing method and wafer manufacturing method
SAMSUNG ELECTRONICS CO LTD2 citations59
US12182490B2Dec 31, 2024
Semiconductor design automation system and computing system including the same
SAMSUNG ELECTRONICS CO LTD0 citations57
US11687696B2Jun 27, 2023
Semiconductor design automation system and computing system including the same
SAMSUNG ELECTRONICS CO LTD0 citations57