P

Inventor

GROTE BERNHARD

US32 patents
⚠️ This page may combine multiple inventors who share the name “GROTE BERNHARD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NXP USA INC

26 patents
US10103257B1Oct 16, 2018

Termination design for trench superjunction power MOSFET

NXP USA INC17 citations93
US10600911B2Mar 24, 2020

Field-effect transistor and method therefor

NXP USA INC7 citations82
US10522677B2Dec 31, 2019

Field-effect transistor and method therefor

NXP USA INC5 citations72
US10431678B2Oct 1, 2019

Termination design for trench superjunction power MOSFET

NXP USA INC4 citations72
US10424646B2Sep 24, 2019

Field-effect transistor and method therefor

NXP USA INC6 citations72
US11018247B1May 25, 2021

Semiconductor device with a base link region and method therefor

NXP USA INC3 citations71
US11777002B2Oct 3, 2023

Laterally-diffused metal-oxide semiconductor transistor and method therefor

NXP USA INC0 citations62
US11631763B2Apr 18, 2023

Termination for trench field plate power MOSFET

NXP USA INC0 citations62
US11329150B2May 10, 2022

Termination for trench field plate power MOSFET

NXP USA INC1 citations62
US11227921B2Jan 18, 2022

Laterally-diffused metal-oxide semiconductor transistor and method therefor

NXP USA INC1 citations62
US11217675B2Jan 4, 2022

Trench with different transverse cross-sectional widths

NXP USA INC0 citations62
US10833174B2Nov 10, 2020

Transistor devices with extended drain regions located in trench sidewalls

NXP USA INC1 citations57
US12538512B2Jan 27, 2026

Semiconductor device with current-carrying electrodes and a conductive element and method of fabrication therefor

NXP USA INC0 citations51
US12349433B2Jul 1, 2025

Transistors with self-aligned source-connected field plates

NXP USA INC0 citations51
US12191383B2Jan 7, 2025

Semiconductor device with an insulating region formed between a control electrode and a conductive element and method of fabrication therefor

NXP USA INC0 citations51
US12057499B2Aug 6, 2024

Transistor devices with termination regions

NXP USA INC0 citations51
US11387348B2Jul 12, 2022

Transistor formed with spacer

NXP USA INC0 citations51
US11329156B2May 10, 2022

Transistor with extended drain region

NXP USA INC0 citations51
US11075110B1Jul 27, 2021

Transistor trench with field plate structure

NXP USA INC0 citations51
US12464799B2Nov 4, 2025

Semiconductor device with a field plate having a recessed region and an overhanging portion and method of fabrication therefor

NXP USA INC0 citations50
US12342560B2Jun 24, 2025

Transistors with source-connected field plates

NXP USA INC0 citations44
US10749028B2Aug 18, 2020

Transistor with gate/field plate structure

NXP USA INC0 citations41
US10749023B2Aug 18, 2020

Vertical transistor with extended drain region

NXP USA INC0 citations41
US10607880B2Mar 31, 2020

Die with buried doped isolation region

NXP USA INC0 citations41
US10600879B2Mar 24, 2020

Transistor trench structure with field plate structures

NXP USA INC0 citations41
US10580856B2Mar 3, 2020

Structure for improved noise signal isolation

NXP USA INC0 citations39

NXP BV

5 patents

FREESCALE SEMICONDUCTOR INC

1 patent