P

Inventor

GODA AKIRA

US308 patents
⚠️ This page may combine multiple inventors who share the name “GODA AKIRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

28 patents
US7057936B2Jun 6, 2006

Nonvolatile semiconductor memory device

TOSHIBA KK179 citations99
US7006379B2Feb 28, 2006

Semiconductor memory

TOSHIBA KK171 citations99
US6925009B2Aug 2, 2005

Semiconductor memory

TOSHIBA KK130 citations99
US6894931B2May 17, 2005

Nonvolatile semiconductor memory device

TOSHIBA KK140 citations99
US6870773B2Mar 22, 2005

Data writing method for semiconductor memory device and semiconductor memory device

TOSHIBA KK112 citations99
US6819592B2Nov 16, 2004

Semiconductor memory

TOSHIBA KK129 citations99
US7245534B2Jul 17, 2007

Nonvolatile semiconductor memory

TOSHIBA KK63 citations98
US7184356B2Feb 27, 2007

Semiconductor memory device

TOSHIBA KK64 citations98
US7099190B2Aug 29, 2006

Data storage system

TOSHIBA KK88 citations98
US6958938B2Oct 25, 2005

Data writing method for semiconductor memory device and semiconductor memory device

TOSHIBA KK78 citations98
US6720612B2Apr 13, 2004

Semiconductor device

TOSHIBA KK75 citations98
US6917072B2Jul 12, 2005

Semiconductor memory device

TOSHIBA KK61 citations96
US7883964B2Feb 8, 2011

Nonvolatile semiconductor memory and a fabrication method thereof

TOSHIBA KK40 citations93
US7592666B2Sep 22, 2009

Semiconductor memory

TOSHIBA KK28 citations93
US7453728B2Nov 18, 2008

Data storage system with enhanced reliability with respect to data destruction caused by reading-out of the data

TOSHIBA KK29 citations93
US7430693B2Sep 30, 2008

Data memory system

TOSHIBA KK42 citations93
US7372113B2May 13, 2008

Semiconductor device and method of manufacturing the same

TOSHIBA KK31 citations93
US7359274B2Apr 15, 2008

Semiconductor memory device

TOSHIBA KK33 citations93
US7038291B2May 2, 2006

Semiconductor device and method of fabricating the same

TOSHIBA KK48 citations93
US6953965B2Oct 11, 2005

Semiconductor device with source line and fabrication method thereof

TOSHIBA KK27 citations93
US6903422B2Jun 7, 2005

Semiconductor integrated circuits, fabrication method for the same and semiconductor integrated circuit systems

TOSHIBA KK38 citations93
US6882592B2Apr 19, 2005

Semiconductor memory device

TOSHIBA KK36 citations93
US6844590B2Jan 18, 2005

Semiconductor device with trench isolation between two regions having different gate insulating films

TOSHIBA KK20 citations93
US6819590B2Nov 16, 2004

Semiconductor memory

TOSHIBA KK51 citations93
US6809967B2Oct 26, 2004

Data writing method for semiconductor memory device and semiconductor memory device

TOSHIBA KK18 citations93
US6784041B2Aug 31, 2004

Semiconductor device and method of manufacturing the same

TOSHIBA KK23 citations93
US6774462B2Aug 10, 2004

Semiconductor device comprising dual silicon nitride layers with varying nitrogen ratio

TOSHIBA KK39 citations93
US6611010B2Aug 26, 2003

Semiconductor device

TOSHIBA KK22 citations93

MICRON TECHNOLOGY INC

19 patents
US9741737B1Aug 22, 2017

Integrated structures comprising vertical channel material and having conductively-doped semiconductor material directly against lower sidewalls of the channel material

MICRON TECHNOLOGY INC105 citations99
US7292476B2Nov 6, 2007

Programming method for NAND EEPROM

MICRON TECHNOLOGY INC126 citations99
US9728266B1Aug 8, 2017

Memory device including multiple select gates and different bias conditions

MICRON TECHNOLOGY INC38 citations98
US7724577B2May 25, 2010

NAND with back biased operation

MICRON TECHNOLOGY INC51 citations98
US7916543B2Mar 29, 2011

Memory cell operation

MICRON TECHNOLOGY INC41 citations96
US11282815B2Mar 22, 2022

Methods of forming microelectronic devices, and related microelectronic devices and electronic systems

MICRON TECHNOLOGY INC14 citations94
US10340286B2Jul 2, 2019

Methods of forming NAND memory arrays

MICRON TECHNOLOGY INC22 citations94
US10418379B2Sep 17, 2019

Integrated structures comprising channel material extending into source material

MICRON TECHNOLOGY INC12 citations93
US10134597B2Nov 20, 2018

Apparatuses including memory cells with gaps comprising low dielectric constant materials

MICRON TECHNOLOGY INC14 citations93
US9941298B2Apr 10, 2018

Methods of forming integrated structures comprising vertical channel material and having conductively-doped semiconductor material directly against lower sidewalls of the channel material

MICRON TECHNOLOGY INC14 citations93
US9853046B2Dec 26, 2017

Apparatuses and methods for forming multiple decks of memory cells

MICRON TECHNOLOGY INC19 citations93
US9679778B2Jun 13, 2017

Methods of forming memory cells with air gaps and other low dielectric constant materials

MICRON TECHNOLOGY INC15 citations93
US9536618B2Jan 3, 2017

Apparatuses and methods to control body potential in memory operations

MICRON TECHNOLOGY INC22 citations93
US9362300B2Jun 7, 2016

Apparatuses and methods for forming multiple decks of memory cells

MICRON TECHNOLOGY INC21 citations93
US9343316B2May 17, 2016

Methods of forming memory cells with air gaps and other low dielectric constant materials

MICRON TECHNOLOGY INC16 citations93
US9184175B2Nov 10, 2015

Floating gate memory cells in vertical memory

MICRON TECHNOLOGY INC15 citations93
US8951865B2Feb 10, 2015

Memory arrays where a distance between adjacent memory cells at one end of a substantially vertical portion is greater than a distance between adjacent memory cells at an opposing end of the substantially vertical portion and formation thereof

MICRON TECHNOLOGY INC16 citations93
US9378839B2Jun 28, 2016

Apparatus and methods including source gates

MICRON TECHNOLOGY INC15 citations92
US9064577B2Jun 23, 2015

Apparatuses and methods to control body potential in memory operations

MICRON TECHNOLOGY INC22 citations92

INTEL CORP

2 patents

GODA AKIRA

1 patent

Showing the top 50 of 308 patents by PatentIndex Score.