Inventor
GODA AKIRA
US308 patents
⚠️ This page may combine multiple inventors who share the name “GODA AKIRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
28 patentsUS7057936B2Jun 6, 2006
Nonvolatile semiconductor memory device
TOSHIBA KK179 citations99
US7006379B2Feb 28, 2006
Semiconductor memory
TOSHIBA KK171 citations99
US6925009B2Aug 2, 2005
Semiconductor memory
TOSHIBA KK130 citations99
US6894931B2May 17, 2005
Nonvolatile semiconductor memory device
TOSHIBA KK140 citations99
US6870773B2Mar 22, 2005
Data writing method for semiconductor memory device and semiconductor memory device
TOSHIBA KK112 citations99
US6819592B2Nov 16, 2004
Semiconductor memory
TOSHIBA KK129 citations99
US7245534B2Jul 17, 2007
Nonvolatile semiconductor memory
TOSHIBA KK63 citations98
US7184356B2Feb 27, 2007
Semiconductor memory device
TOSHIBA KK64 citations98
US7099190B2Aug 29, 2006
Data storage system
TOSHIBA KK88 citations98
US6958938B2Oct 25, 2005
Data writing method for semiconductor memory device and semiconductor memory device
TOSHIBA KK78 citations98
US6720612B2Apr 13, 2004
Semiconductor device
TOSHIBA KK75 citations98
US6917072B2Jul 12, 2005
Semiconductor memory device
TOSHIBA KK61 citations96
US7883964B2Feb 8, 2011
Nonvolatile semiconductor memory and a fabrication method thereof
TOSHIBA KK40 citations93
US7592666B2Sep 22, 2009
Semiconductor memory
TOSHIBA KK28 citations93
US7453728B2Nov 18, 2008
Data storage system with enhanced reliability with respect to data destruction caused by reading-out of the data
TOSHIBA KK29 citations93
US7430693B2Sep 30, 2008
Data memory system
TOSHIBA KK42 citations93
US7372113B2May 13, 2008
Semiconductor device and method of manufacturing the same
TOSHIBA KK31 citations93
US7359274B2Apr 15, 2008
Semiconductor memory device
TOSHIBA KK33 citations93
US7038291B2May 2, 2006
Semiconductor device and method of fabricating the same
TOSHIBA KK48 citations93
US6953965B2Oct 11, 2005
Semiconductor device with source line and fabrication method thereof
TOSHIBA KK27 citations93
US6903422B2Jun 7, 2005
Semiconductor integrated circuits, fabrication method for the same and semiconductor integrated circuit systems
TOSHIBA KK38 citations93
US6882592B2Apr 19, 2005
Semiconductor memory device
TOSHIBA KK36 citations93
US6844590B2Jan 18, 2005
Semiconductor device with trench isolation between two regions having different gate insulating films
TOSHIBA KK20 citations93
US6819590B2Nov 16, 2004
Semiconductor memory
TOSHIBA KK51 citations93
US6809967B2Oct 26, 2004
Data writing method for semiconductor memory device and semiconductor memory device
TOSHIBA KK18 citations93
US6784041B2Aug 31, 2004
Semiconductor device and method of manufacturing the same
TOSHIBA KK23 citations93
US6774462B2Aug 10, 2004
Semiconductor device comprising dual silicon nitride layers with varying nitrogen ratio
TOSHIBA KK39 citations93
US6611010B2Aug 26, 2003
Semiconductor device
TOSHIBA KK22 citations93
MICRON TECHNOLOGY INC
19 patentsUS9741737B1Aug 22, 2017
Integrated structures comprising vertical channel material and having conductively-doped semiconductor material directly against lower sidewalls of the channel material
MICRON TECHNOLOGY INC105 citations99
US7292476B2Nov 6, 2007
Programming method for NAND EEPROM
MICRON TECHNOLOGY INC126 citations99
US9728266B1Aug 8, 2017
Memory device including multiple select gates and different bias conditions
MICRON TECHNOLOGY INC38 citations98
US7724577B2May 25, 2010
NAND with back biased operation
MICRON TECHNOLOGY INC51 citations98
US7916543B2Mar 29, 2011
Memory cell operation
MICRON TECHNOLOGY INC41 citations96
US11282815B2Mar 22, 2022
Methods of forming microelectronic devices, and related microelectronic devices and electronic systems
MICRON TECHNOLOGY INC14 citations94
US10340286B2Jul 2, 2019
Methods of forming NAND memory arrays
MICRON TECHNOLOGY INC22 citations94
US10418379B2Sep 17, 2019
Integrated structures comprising channel material extending into source material
MICRON TECHNOLOGY INC12 citations93
US10134597B2Nov 20, 2018
Apparatuses including memory cells with gaps comprising low dielectric constant materials
MICRON TECHNOLOGY INC14 citations93
US9941298B2Apr 10, 2018
Methods of forming integrated structures comprising vertical channel material and having conductively-doped semiconductor material directly against lower sidewalls of the channel material
MICRON TECHNOLOGY INC14 citations93
US9853046B2Dec 26, 2017
Apparatuses and methods for forming multiple decks of memory cells
MICRON TECHNOLOGY INC19 citations93
US9679778B2Jun 13, 2017
Methods of forming memory cells with air gaps and other low dielectric constant materials
MICRON TECHNOLOGY INC15 citations93
US9536618B2Jan 3, 2017
Apparatuses and methods to control body potential in memory operations
MICRON TECHNOLOGY INC22 citations93
US9362300B2Jun 7, 2016
Apparatuses and methods for forming multiple decks of memory cells
MICRON TECHNOLOGY INC21 citations93
US9343316B2May 17, 2016
Methods of forming memory cells with air gaps and other low dielectric constant materials
MICRON TECHNOLOGY INC16 citations93
US9184175B2Nov 10, 2015
Floating gate memory cells in vertical memory
MICRON TECHNOLOGY INC15 citations93
US8951865B2Feb 10, 2015
Memory arrays where a distance between adjacent memory cells at one end of a substantially vertical portion is greater than a distance between adjacent memory cells at an opposing end of the substantially vertical portion and formation thereof
MICRON TECHNOLOGY INC16 citations93
US9378839B2Jun 28, 2016
Apparatus and methods including source gates
MICRON TECHNOLOGY INC15 citations92
US9064577B2Jun 23, 2015
Apparatuses and methods to control body potential in memory operations
MICRON TECHNOLOGY INC22 citations92
INTEL CORP
2 patentsGODA AKIRA
1 patentShowing the top 50 of 308 patents by PatentIndex Score.