P

Inventor

GOODWIN ERIC PETER

US45 patents
⚠️ This page may combine multiple inventors who share the name “GOODWIN ERIC PETER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIKON CORP

36 patents
US9638799B2May 2, 2017

Scan mirrors for laser radar

NIKON CORP74 citations97
US8993974B2Mar 31, 2015

Color time domain integration camera having a single charge coupled device and fringe projection auto-focus system

NIKON CORP38 citations94
US10139492B2Nov 27, 2018

Radar systems with dual fiber coupled lasers

NIKON CORP5 citations83
US9618619B2Apr 11, 2017

Radar systems with dual fiber coupled lasers

NIKON CORP8 citations83
US11099007B2Aug 24, 2021

Test of operational status of a digital scanner during lithographic exposure process

NIKON CORP4 citations73
US10794689B2Oct 6, 2020

Autofocus system and method

NIKON CORP2 citations73
US10302419B2May 28, 2019

System and method for a displacement measurement

NIKON CORP3 citations73
US10267625B2Apr 23, 2019

Determination of operability of a digital scanner with shearing interferometry

NIKON CORP2 citations73
US10180496B2Jan 15, 2019

Laser radar with remote local oscillator

NIKON CORP1 citations72
US11248901B2Feb 15, 2022

Shearing interferometry measurement device for microscopy

NIKON CORP2 citations66
US9243896B2Jan 26, 2016

Two axis encoder head assembly

NIKON CORP2 citations63
US12566058B2Mar 3, 2026

Compact shearography system with adjustable shear distance

NIKON CORP0 citations62
US12275066B2Apr 15, 2025

Systems and methods for improved melting in three-dimensional printing processes

NIKON CORP0 citations62
US10928187B2Feb 23, 2021

Compensation for Goos-Hanchen error in autofocus systems

NIKON CORP0 citations62
US12584728B2Mar 24, 2026

Measurement of melt pool position in additive manufacturing

NIKON CORP0 citations58
US12104891B1Oct 1, 2024

Spatially filtered talbot interferometer for wafer distortion measurement

NIKON CORP1 citations54
US12240039B2Mar 4, 2025

Systems and methods for measuring radiation emitted during a three-dimensional printing process

NIKON CORP0 citations52
US12203745B2Jan 21, 2025

Metrology for additive manufacturing

NIKON CORP0 citations52
US10845191B2Nov 24, 2020

System and method for a displacement measurement

NIKON CORP0 citations52
US10753732B2Aug 25, 2020

Determination of operability of a digital scanner with shearing interferometry

NIKON CORP0 citations52
US10719017B2Jul 21, 2020

Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror

NIKON CORP0 citations52
US10591826B2Mar 17, 2020

Encoder head with a birefringent lens element and exposure system utilizing the same

NIKON CORP0 citations52
US10488228B2Nov 26, 2019

Transparent-block encoder head with isotropic wedged elements

NIKON CORP0 citations52
US9977343B2May 22, 2018

Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror

NIKON CORP1 citations52
US9816805B2Nov 14, 2017

Compensation for Goos-Hanchen error in autofocus systems

NIKON CORP0 citations52
US9810530B2Nov 7, 2017

Autofocus system and method

NIKON CORP0 citations52
US9605948B2Mar 28, 2017

Minimization of Abbe error caused by tip or tilt between an encoder head and a wafer stage for arbitrary location of a center of rotation

NIKON CORP1 citations52
US9360347B2Jun 7, 2016

Two-dimensional encoder system and method

NIKON CORP1 citations52
US9243901B2Jan 26, 2016

Rules for reducing the sensitivity of fringe projection autofocus to air temperature changes

NIKON CORP1 citations52
US9237261B2Jan 12, 2016

Apparatus and method for improving contrast detected in a fringe projection autofocus system

NIKON CORP0 citations52
US9097851B2Aug 4, 2015

System and method for compensating instability in an autofocus system

NIKON CORP1 citations52
US9030668B2May 12, 2015

Method for spatially multiplexing two or more fringe projection signals on a single detector

NIKON CORP1 citations52
US10078269B2Sep 18, 2018

Array of encoders for alignment measurement

NIKON CORP1 citations49
US10483107B2Nov 19, 2019

Encoder head with birefringent elements for forming imperfect retroreflection and exposure system utilizing the same

NIKON CORP0 citations42
US9194694B2Nov 24, 2015

Interferometer devices for determining initial position of a stage or the like

NIKON CORP0 citations42
US10812695B2Oct 20, 2020

Three-dimensional positioning system using surface pattern recognition and interpolation

NIKON CORP0 citations36

GOODWIN ERIC PETER

7 patents

NIKON RES CORPORATION OF AMERICA

1 patent

SMITH DANIEL GENE

1 patent