Inventor
GOODWIN ERIC PETER
US45 patents
⚠️ This page may combine multiple inventors who share the name “GOODWIN ERIC PETER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIKON CORP
36 patentsUS9638799B2May 2, 2017
Scan mirrors for laser radar
NIKON CORP74 citations97
US8993974B2Mar 31, 2015
Color time domain integration camera having a single charge coupled device and fringe projection auto-focus system
NIKON CORP38 citations94
US10139492B2Nov 27, 2018
Radar systems with dual fiber coupled lasers
NIKON CORP5 citations83
US9618619B2Apr 11, 2017
Radar systems with dual fiber coupled lasers
NIKON CORP8 citations83
US11099007B2Aug 24, 2021
Test of operational status of a digital scanner during lithographic exposure process
NIKON CORP4 citations73
US10794689B2Oct 6, 2020
Autofocus system and method
NIKON CORP2 citations73
US10302419B2May 28, 2019
System and method for a displacement measurement
NIKON CORP3 citations73
US10267625B2Apr 23, 2019
Determination of operability of a digital scanner with shearing interferometry
NIKON CORP2 citations73
US10180496B2Jan 15, 2019
Laser radar with remote local oscillator
NIKON CORP1 citations72
US11248901B2Feb 15, 2022
Shearing interferometry measurement device for microscopy
NIKON CORP2 citations66
US9243896B2Jan 26, 2016
Two axis encoder head assembly
NIKON CORP2 citations63
US12566058B2Mar 3, 2026
Compact shearography system with adjustable shear distance
NIKON CORP0 citations62
US12275066B2Apr 15, 2025
Systems and methods for improved melting in three-dimensional printing processes
NIKON CORP0 citations62
US10928187B2Feb 23, 2021
Compensation for Goos-Hanchen error in autofocus systems
NIKON CORP0 citations62
US12584728B2Mar 24, 2026
Measurement of melt pool position in additive manufacturing
NIKON CORP0 citations58
US12104891B1Oct 1, 2024
Spatially filtered talbot interferometer for wafer distortion measurement
NIKON CORP1 citations54
US12240039B2Mar 4, 2025
Systems and methods for measuring radiation emitted during a three-dimensional printing process
NIKON CORP0 citations52
US12203745B2Jan 21, 2025
Metrology for additive manufacturing
NIKON CORP0 citations52
US10845191B2Nov 24, 2020
System and method for a displacement measurement
NIKON CORP0 citations52
US10753732B2Aug 25, 2020
Determination of operability of a digital scanner with shearing interferometry
NIKON CORP0 citations52
US10719017B2Jul 21, 2020
Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror
NIKON CORP0 citations52
US10591826B2Mar 17, 2020
Encoder head with a birefringent lens element and exposure system utilizing the same
NIKON CORP0 citations52
US10488228B2Nov 26, 2019
Transparent-block encoder head with isotropic wedged elements
NIKON CORP0 citations52
US9977343B2May 22, 2018
Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror
NIKON CORP1 citations52
US9816805B2Nov 14, 2017
Compensation for Goos-Hanchen error in autofocus systems
NIKON CORP0 citations52
US9810530B2Nov 7, 2017
Autofocus system and method
NIKON CORP0 citations52
US9605948B2Mar 28, 2017
Minimization of Abbe error caused by tip or tilt between an encoder head and a wafer stage for arbitrary location of a center of rotation
NIKON CORP1 citations52
US9360347B2Jun 7, 2016
Two-dimensional encoder system and method
NIKON CORP1 citations52
US9243901B2Jan 26, 2016
Rules for reducing the sensitivity of fringe projection autofocus to air temperature changes
NIKON CORP1 citations52
US9237261B2Jan 12, 2016
Apparatus and method for improving contrast detected in a fringe projection autofocus system
NIKON CORP0 citations52
US9097851B2Aug 4, 2015
System and method for compensating instability in an autofocus system
NIKON CORP1 citations52
US9030668B2May 12, 2015
Method for spatially multiplexing two or more fringe projection signals on a single detector
NIKON CORP1 citations52
US10078269B2Sep 18, 2018
Array of encoders for alignment measurement
NIKON CORP1 citations49
US10483107B2Nov 19, 2019
Encoder head with birefringent elements for forming imperfect retroreflection and exposure system utilizing the same
NIKON CORP0 citations42
US9194694B2Nov 24, 2015
Interferometer devices for determining initial position of a stage or the like
NIKON CORP0 citations42
US10812695B2Oct 20, 2020
Three-dimensional positioning system using surface pattern recognition and interpolation
NIKON CORP0 citations36
GOODWIN ERIC PETER
7 patentsUS8829420B2Sep 9, 2014
Two dimensional encoder system and method
GOODWIN ERIC PETER10 citations83
US8724095B2May 13, 2014
Optical assembly for laser radar
GOODWIN ERIC PETER9 citations82
US9625368B2Apr 18, 2017
Apparatus, optical assembly, method for inspection or measurement of an object and method for manufacturing a structure
GOODWIN ERIC PETER5 citations70
US9074911B2Jul 7, 2015
Measurement system and method utilizing high contrast encoder head for measuring relative movement between objects
GOODWIN ERIC PETER1 citations51
US9534934B2Jan 3, 2017
High resolution encoder head
GOODWIN ERIC PETER0 citations41
US9291918B2Mar 22, 2016
Light source assembly that generates heterodyne output beams
GOODWIN ERIC PETER0 citations41
US9213227B2Dec 15, 2015
Custom color or polarization sensitive CCD for separating multiple signals in autofocus projection system
GOODWIN ERIC PETER0 citations41