P

Inventor

SMITH DANIEL GENE

US37 patents
⚠️ This page may combine multiple inventors who share the name “SMITH DANIEL GENE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIKON CORP

28 patents
US7982884B2Jul 19, 2011

Autofocus system with error compensation

NIKON CORP7 citations84
US11982521B2May 14, 2024

Measurement of a change in a geometrical characteristic and/or position of a workpiece

NIKON CORP2 citations73
US11934105B2Mar 19, 2024

Optical objective for operation in EUV spectral region

NIKON CORP2 citations73
US10837763B2Nov 17, 2020

Optical assembly, method for producing data in the same, and method for manufacturing structure

NIKON CORP2 citations73
US10794689B2Oct 6, 2020

Autofocus system and method

NIKON CORP2 citations73
US11061338B2Jul 13, 2021

High-resolution position encoder with image sensor and encoded target pattern

NIKON CORP3 citations65
US12566058B2Mar 3, 2026

Compact shearography system with adjustable shear distance

NIKON CORP0 citations62
US11578969B2Feb 14, 2023

Optical assembly, method for producing data in the same, and method for manufacturing structure

NIKON CORP0 citations62
US11300884B2Apr 12, 2022

Illumination system with curved 1d-patterned mask for use in EUV-exposure tool

NIKON CORP1 citations62
US11099483B2Aug 24, 2021

Euv lithography system for dense line patterning

NIKON CORP1 citations62
US11054745B2Jul 6, 2021

Illumination system with flat 1D-patterned mask for use in EUV-exposure tool

NIKON CORP0 citations62
US10928187B2Feb 23, 2021

Compensation for Goos-Hanchen error in autofocus systems

NIKON CORP0 citations62
US10890849B2Jan 12, 2021

EUV lithography system for dense line patterning

NIKON CORP1 citations62
US10747117B2Aug 18, 2020

Extreme ultraviolet lithography system that utilizes pattern stitching

NIKON CORP1 citations62
US10295911B2May 21, 2019

Extreme ultraviolet lithography system that utilizes pattern stitching

NIKON CORP1 citations62
US10197668B2Feb 5, 2019

Eighth wave corner cube retarder for laser radar

NIKON CORP1 citations62
US12346029B2Jul 1, 2025

Curved reticle by mechanical and phase bending along orthogonal axes

NIKON CORP0 citations56
US12104891B1Oct 1, 2024

Spatially filtered talbot interferometer for wafer distortion measurement

NIKON CORP1 citations54
US12203745B2Jan 21, 2025

Metrology for additive manufacturing

NIKON CORP0 citations52
US10719017B2Jul 21, 2020

Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror

NIKON CORP0 citations52
US10690317B2Jun 23, 2020

Illumination device for optimizing polarization in an illumination pupil

NIKON CORP0 citations52
US9977343B2May 22, 2018

Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror

NIKON CORP1 citations52
US9816805B2Nov 14, 2017

Compensation for Goos-Hanchen error in autofocus systems

NIKON CORP0 citations52
US9810530B2Nov 7, 2017

Autofocus system and method

NIKON CORP0 citations52
US9732934B2Aug 15, 2017

Illumination device for optimizing polarization in an illumination pupil

NIKON CORP0 citations52
US9360347B2Jun 7, 2016

Two-dimensional encoder system and method

NIKON CORP1 citations52
US9097851B2Aug 4, 2015

System and method for compensating instability in an autofocus system

NIKON CORP1 citations52
US9091941B2Jul 28, 2015

Fast illumination simulator based on a calibrated flexible point-spread function

NIKON CORP1 citations51

GOODWIN ERIC PETER

5 patents

SMITH DANIEL GENE

3 patents

NIPPON KOGAKU KK

1 patent