Inventor
SMITH DANIEL GENE
US37 patents
⚠️ This page may combine multiple inventors who share the name “SMITH DANIEL GENE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIKON CORP
28 patentsUS7982884B2Jul 19, 2011
Autofocus system with error compensation
NIKON CORP7 citations84
US11982521B2May 14, 2024
Measurement of a change in a geometrical characteristic and/or position of a workpiece
NIKON CORP2 citations73
US11934105B2Mar 19, 2024
Optical objective for operation in EUV spectral region
NIKON CORP2 citations73
US10837763B2Nov 17, 2020
Optical assembly, method for producing data in the same, and method for manufacturing structure
NIKON CORP2 citations73
US10794689B2Oct 6, 2020
Autofocus system and method
NIKON CORP2 citations73
US11061338B2Jul 13, 2021
High-resolution position encoder with image sensor and encoded target pattern
NIKON CORP3 citations65
US12566058B2Mar 3, 2026
Compact shearography system with adjustable shear distance
NIKON CORP0 citations62
US11578969B2Feb 14, 2023
Optical assembly, method for producing data in the same, and method for manufacturing structure
NIKON CORP0 citations62
US11300884B2Apr 12, 2022
Illumination system with curved 1d-patterned mask for use in EUV-exposure tool
NIKON CORP1 citations62
US11099483B2Aug 24, 2021
Euv lithography system for dense line patterning
NIKON CORP1 citations62
US11054745B2Jul 6, 2021
Illumination system with flat 1D-patterned mask for use in EUV-exposure tool
NIKON CORP0 citations62
US10928187B2Feb 23, 2021
Compensation for Goos-Hanchen error in autofocus systems
NIKON CORP0 citations62
US10890849B2Jan 12, 2021
EUV lithography system for dense line patterning
NIKON CORP1 citations62
US10747117B2Aug 18, 2020
Extreme ultraviolet lithography system that utilizes pattern stitching
NIKON CORP1 citations62
US10295911B2May 21, 2019
Extreme ultraviolet lithography system that utilizes pattern stitching
NIKON CORP1 citations62
US10197668B2Feb 5, 2019
Eighth wave corner cube retarder for laser radar
NIKON CORP1 citations62
US12346029B2Jul 1, 2025
Curved reticle by mechanical and phase bending along orthogonal axes
NIKON CORP0 citations56
US12104891B1Oct 1, 2024
Spatially filtered talbot interferometer for wafer distortion measurement
NIKON CORP1 citations54
US12203745B2Jan 21, 2025
Metrology for additive manufacturing
NIKON CORP0 citations52
US10719017B2Jul 21, 2020
Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror
NIKON CORP0 citations52
US10690317B2Jun 23, 2020
Illumination device for optimizing polarization in an illumination pupil
NIKON CORP0 citations52
US9977343B2May 22, 2018
Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror
NIKON CORP1 citations52
US9816805B2Nov 14, 2017
Compensation for Goos-Hanchen error in autofocus systems
NIKON CORP0 citations52
US9810530B2Nov 7, 2017
Autofocus system and method
NIKON CORP0 citations52
US9732934B2Aug 15, 2017
Illumination device for optimizing polarization in an illumination pupil
NIKON CORP0 citations52
US9360347B2Jun 7, 2016
Two-dimensional encoder system and method
NIKON CORP1 citations52
US9097851B2Aug 4, 2015
System and method for compensating instability in an autofocus system
NIKON CORP1 citations52
US9091941B2Jul 28, 2015
Fast illumination simulator based on a calibrated flexible point-spread function
NIKON CORP1 citations51
GOODWIN ERIC PETER
5 patentsUS8829420B2Sep 9, 2014
Two dimensional encoder system and method
GOODWIN ERIC PETER10 citations83
US8724095B2May 13, 2014
Optical assembly for laser radar
GOODWIN ERIC PETER9 citations82
US9625368B2Apr 18, 2017
Apparatus, optical assembly, method for inspection or measurement of an object and method for manufacturing a structure
GOODWIN ERIC PETER5 citations70
US9074911B2Jul 7, 2015
Measurement system and method utilizing high contrast encoder head for measuring relative movement between objects
GOODWIN ERIC PETER1 citations51
US9213227B2Dec 15, 2015
Custom color or polarization sensitive CCD for separating multiple signals in autofocus projection system
GOODWIN ERIC PETER0 citations41
SMITH DANIEL GENE
3 patentsUS8736813B2May 27, 2014
Exposure apparatus with an illumination system generating multiple illumination beams
SMITH DANIEL GENE1 citations49
US8820948B2Sep 2, 2014
Compound parabolic collectors for projection lens metrology
SMITH DANIEL GENE0 citations38
US8422027B2Apr 16, 2013
Imaging optical system for producing control information regarding lateral movement of an image plane or an object plane
SMITH DANIEL GENE0 citations38