Inventor
COURTEVILLE ALAIN
FR13 patents
⚠️ This page may combine multiple inventors who share the name “COURTEVILLE ALAIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FOGALE NANOTECH
8 patentsUS9739600B1Aug 22, 2017
Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer
FOGALE NANOTECH33 citations92
US9494529B1Nov 15, 2016
Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolution
FOGALE NANOTECH22 citations91
US12359910B2Jul 15, 2025
Device and method for measuring interfaces of an optical element
FOGALE NANOTECH2 citations69
US11808656B2Nov 7, 2023
Device and method for measuring interfaces of an optical element
FOGALE NANOTECH4 citations67
US10919157B2Feb 16, 2021
Multi-distance detection device for a robot, and robot equipped with such (a) device(s)
FOGALE NANOTECH1 citations61
US10240977B2Mar 26, 2019
Method for 2D/3D inspection of an object such as a wafer
FOGALE NANOTECH1 citations61
US12163777B2Dec 10, 2024
Device and method for imaging and interferometry measurements
FOGALE NANOTECH0 citations50
US11226188B2Jan 18, 2022
Low-coherence reflectometry method and device employing time-frequency detection
FOGALE NANOTECH0 citations46
UNITY SEMICONDUCTOR
3 patentsUS12444039B2Oct 14, 2025
Method and a system for characterising structures through a substrate
UNITY SEMICONDUCTOR0 citations57
US12079979B2Sep 3, 2024
Method and a system for characterising structures through a substrate
UNITY SEMICONDUCTOR0 citations57
US12123698B1Oct 22, 2024
Method and a system for characterizing structures through a substrate
UNITY SEMICONDUCTOR0 citations41