P

Inventor

TRIPSAS NICHOLAS H

US53 patents
⚠️ This page may combine multiple inventors who share the name “TRIPSAS NICHOLAS H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED MICRO DEVICES INC

41 patents
US6803272B1Oct 12, 2004

Use of high-K dielectric material in modified ONO structure for semiconductor devices

ADVANCED MICRO DEVICES INC149 citations99
US6674138B1Jan 6, 2004

Use of high-k dielectric materials in modified ONO structure for semiconductor devices

ADVANCED MICRO DEVICES INC490 citations99
US6746971B1Jun 8, 2004

Method of forming copper sulfide for memory cell

ADVANCED MICRO DEVICES INC120 citations98
US6639271B1Oct 28, 2003

Fully isolated dielectric memory cell structure for a dual bit nitride storage device and process for making same

ADVANCED MICRO DEVICES INC99 citations98
US6787458B1Sep 7, 2004

Polymer memory device formed in via opening

ADVANCED MICRO DEVICES INC63 citations96
US6753247B1Jun 22, 2004

Method(s) facilitating formation of memory cell(s) and patterned conductive

ADVANCED MICRO DEVICES INC53 citations96
US6630383B1Oct 7, 2003

Bi-layer floating gate for improved work function between floating gate and a high-K dielectric layer

ADVANCED MICRO DEVICES INC74 citations96
US6977389B2Dec 20, 2005

Planar polymer memory device

ADVANCED MICRO DEVICES INC51 citations93
US6872643B1Mar 29, 2005

Implant damage removal by laser thermal annealing

ADVANCED MICRO DEVICES INC18 citations93
US6852586B1Feb 8, 2005

Self assembly of conducting polymer for formation of polymer memory cell

ADVANCED MICRO DEVICES INC26 citations93
US6783591B1Aug 31, 2004

Laser thermal annealing method for high dielectric constant gate oxide films

ADVANCED MICRO DEVICES INC20 citations93
US6753570B1Jun 22, 2004

Memory device and method of making

ADVANCED MICRO DEVICES INC27 citations93
US6627945B1Sep 30, 2003

Memory device and method of making

ADVANCED MICRO DEVICES INC21 citations93
US6420702B1Jul 16, 2002

Non-charging critical dimension SEM metrology standard

ADVANCED MICRO DEVICES INC33 citations93
US6979837B2Dec 27, 2005

Stacked organic memory devices and methods of operating and fabricating

ADVANCED MICRO DEVICES INC19 citations92
US6870183B2Mar 22, 2005

Stacked organic memory devices and methods of operating and fabricating

ADVANCED MICRO DEVICES INC29 citations92
US6861307B2Mar 1, 2005

Fully isolated dielectric memory cell structure for a dual bit nitride storage device and process for making same

ADVANCED MICRO DEVICES INC26 citations92
US6735123B1May 11, 2004

High density dual bit flash memory cell with non planar structure

ADVANCED MICRO DEVICES INC20 citations92
US6355933B1Mar 12, 2002

Ion source and method for using same

ADVANCED MICRO DEVICES INC36 citations92
US6034395AMar 7, 2000

Semiconductor device having a reduced height floating gate

ADVANCED MICRO DEVICES INC21 citations92
US5888867AMar 30, 1999

Non-uniform threshold voltage adjustment in flash eproms through gate work function alteration

ADVANCED MICRO DEVICES INC49 citations92
US8049334B1Nov 1, 2011

Buried silicide local interconnect with sidewall spacers and method for making the same

ADVANCED MICRO DEVICES INC8 citations84
US7465956B1Dec 16, 2008

Stacked organic memory devices and methods of operating and fabricating

ADVANCED MICRO DEVICES INC11 citations84
US7232765B1Jun 19, 2007

Utilization of a Ta-containing cap over copper to facilitate concurrent formation of copper vias and memory element structures

ADVANCED MICRO DEVICES INC11 citations84
US6579778B1Jun 17, 2003

Source bus formation for a flash memory using silicide

ADVANCED MICRO DEVICES INC15 citations84
US6030868AFeb 29, 2000

Elimination of oxynitride (ONO) etch residue and polysilicon stringers through isolation of floating gates on adjacent bitlines by polysilicon oxidation

ADVANCED MICRO DEVICES INC16 citations84
US7561465B2Jul 14, 2009

Methods and systems for recovering data in a nonvolatile memory array

ADVANCED MICRO DEVICES INC17 citations79
US6667243B1Dec 23, 2003

Etch damage repair with thermal annealing

ADVANCED MICRO DEVICES INC6 citations74
US6548855B1Apr 15, 2003

Non-volatile memory dielectric as charge pump dielectric

ADVANCED MICRO DEVICES INC7 citations74
US6025240AFeb 15, 2000

Method and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devices

ADVANCED MICRO DEVICES INC12 citations74
US5789802AAug 4, 1998

Dopant profile spreading for arsenic source/drain

ADVANCED MICRO DEVICES INC9 citations74
US6455888B1Sep 24, 2002

Memory cell structure for elimination of oxynitride (ONO) etch residue and polysilicon stringers

ADVANCED MICRO DEVICES INC10 citations73
US7786003B1Aug 31, 2010

Buried silicide local interconnect with sidewall spacers and method for making the same

ADVANCED MICRO DEVICES INC5 citations72
US8368219B2Feb 5, 2013

Buried silicide local interconnect with sidewall spacers and method for making the same

ADVANCED MICRO DEVICES INC3 citations63
US7001807B1Feb 21, 2006

Fully isolated dielectric memory cell structure for a dual bit nitride storage device and process for making same

ADVANCED MICRO DEVICES INC6 citations63
US6500713B1Dec 31, 2002

Method for repairing damage to charge trapping dielectric layer from bit line implantation

ADVANCED MICRO DEVICES INC5 citations63
US6110833AAug 29, 2000

Elimination of oxynitride (ONO) etch residue and polysilicon stringers through isolation of floating gates on adjacent bitlines by polysilicon oxidation

ADVANCED MICRO DEVICES INC4 citations62
US6043120AMar 28, 2000

Elimination of oxynitride (ONO) etch residue and polysilicon stringers through isolation of floating gates on adjacent bitlines by polysilicon oxidation

ADVANCED MICRO DEVICES INC6 citations62
US7670936B1Mar 2, 2010

Nitridation of gate oxide by laser processing

ADVANCED MICRO DEVICES INC0 citations52
US6410956B1Jun 25, 2002

Method and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devices

ADVANCED MICRO DEVICES INC1 citations52
US6153487ANov 28, 2000

Approach for the formation of semiconductor devices which reduces band-to-band tunneling current and short-channel effects

ADVANCED MICRO DEVICES INC0 citations52

SPANSION LLC

9 patents

Showing the top 50 of 53 patents by PatentIndex Score.