Inventor
FUKASAWA YOSHIHITO
JP16 patents
⚠️ This page may combine multiple inventors who share the name “FUKASAWA YOSHIHITO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
4 patentsUS5805472ASep 8, 1998
Test handler for semiconductor devices
TOSHIBA KK98 citations97
US4930086AMay 29, 1990
Method and apparatus for sequential product processing with limited product bar code reading
TOSHIBA KK30 citations92
US6593761B1Jul 15, 2003
Test handler for semiconductor device
TOSHIBA KK36 citations88
US4874956AOct 17, 1989
Method and apparatus for inspecting semiconductor devices for their bonding status
TOSHIBA KK15 citations72