Inventor
CHEN KUANG-SHING
TW8 patents
⚠️ This page may combine multiple inventors who share the name “CHEN KUANG-SHING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
7 patentsUS12387318B2Aug 12, 2025
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US12243218B2Mar 4, 2025
Method and system for scanning wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11900586B2Feb 13, 2024
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11783469B2Oct 10, 2023
Method and system for scanning wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11037289B2Jun 15, 2021
Method and system for scanning wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11984365B2May 14, 2024
Semiconductor structure inspection using a high atomic number material
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10872406B2Dec 22, 2020
Hot spot defect detecting method and hot spot defect detecting system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48