Inventor
HUANG YU-HSUAN
TW10 patents
⚠️ This page may combine multiple inventors who share the name “HUANG YU-HSUAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
4 patentsUS10510623B2Dec 17, 2019
Overlay error and process window metrology
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations70
US11121046B2Sep 14, 2021
Wafer-level testing method and test structure thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations68
US12061229B2Aug 13, 2024
In-line electrical detection of defects at wafer level
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10879135B2Dec 29, 2020
Overlay error and process window metrology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49