Inventor
SHINDE MAKARAND S
US15 patents
Patents
15 patentsUS6856150B2Feb 15, 2005
Probe card with coplanar daughter card
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US7285968B2Oct 23, 2007
Apparatus and method for managing thermally induced motion of a probe card assembly
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US7071715B2Jul 4, 2006
Probe card configuration for low mechanical flexural strength electrical routing substrates
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US7230437B2Jun 12, 2007
Mechanically reconfigurable vertical tester interface for IC probing
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US7312618B2Dec 25, 2007
Method and system for compensating thermally induced motion of probe cards
FORMFACTOR INC12 citations92
US7471094B2Dec 30, 2008
Method and apparatus for adjusting a multi-substrate probe structure
FORMFACTOR INC30 citations90
US7116119B2Oct 3, 2006
Probe card with coplanar daughter card
FORMFACTOR INC38 citations90
US7671614B2Mar 2, 2010
Apparatus and method for adjusting an orientation of probes
FORMFACTOR INC15 citations84
US7659736B2Feb 9, 2010
Mechanically reconfigurable vertical tester interface for IC probing
FORMFACTOR INC8 citations84
US7560941B2Jul 14, 2009
Method and system for compensating thermally induced motion of probe cards
FORMFACTOR INC8 citations84
US7592821B2Sep 22, 2009
Apparatus and method for managing thermally induced motion of a probe card assembly
FORMFACTOR INC11 citations83
US7825674B2Nov 2, 2010
Probe card configuration for low mechanical flexural strength electrical routing substrates
FORMFACTOR INC7 citations73
US7692433B2Apr 6, 2010
Sawing tile corners on probe card substrates
FORMFACTOR INC7 citations70
US7642794B2Jan 5, 2010
Method and system for compensating thermally induced motion of probe cards
FORMFACTOR INC3 citations63
US7845072B2Dec 7, 2010
Method and apparatus for adjusting a multi-substrate probe structure
FORMFACTOR INC2 citations60