Inventor

YOUN JAEYOUN

KR25 patents

Patents

25 patents

US11250894B2Feb 15, 2022

Memory device for supporting new command input scheme and method of operating the same

SAMSUNG ELECTRONICS CO LTD6 citations84

US11170868B2Nov 9, 2021

Semiconductor memory devices and memory systems

SAMSUNG ELECTRONICS CO LTD8 citations83

US11301399B2Apr 12, 2022

Memory device including processing circuit, and electronic device including system on chip and memory device

SAMSUNG ELECTRONICS CO LTD3 citations72

US12002543B2Jun 4, 2024

Memory device for supporting new command input scheme and method of operating the same

SAMSUNG ELECTRONICS CO LTD1 citations71

US11636885B2Apr 25, 2023

Memory device for supporting new command input scheme and method of operating the same

SAMSUNG ELECTRONICS CO LTD1 citations71

US11335392B2May 17, 2022

Memory devices including processing elements, and memory systems including memory devices

SAMSUNG ELECTRONICS CO LTD4 citations71

US9747998B2Aug 29, 2017

Test method of semiconductor memory device and semiconductor memory system transferring fail address data from a volatile to a non-volatile memory array using an error-correction code engine

SAMSUNG ELECTRONICS CO LTD6 citations71

US11604693B2Mar 14, 2023

Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same

SAMSUNG ELECTRONICS CO LTD2 citations70

US12399847B2Aug 26, 2025

Memory device including processing circuit, and electronic device including system on chip and memory device

SAMSUNG ELECTRONICS CO LTD0 citations62

US11869571B2Jan 9, 2024

Memory device, a controller for controlling the same, a memory system including the same, and a method of operating the same

SAMSUNG ELECTRONICS CO LTD0 citations62

US11860803B2Jan 2, 2024

Memory device including processing circuit, and electronic device including system on chip and memory device

SAMSUNG ELECTRONICS CO LTD0 citations62

US11620504B2Apr 4, 2023

Neuromorphic device based on memory

SAMSUNG ELECTRONICS CO LTD0 citations62

US11462255B2Oct 4, 2022

Memory device, a controller for controlling the same, a memory system including the same, and a method of operating the same

SAMSUNG ELECTRONICS CO LTD1 citations62

US11127713B2Sep 21, 2021

High bandwidth memories and systems including the same

SAMSUNG ELECTRONICS CO LTD1 citations62

US12387771B2Aug 12, 2025

Memory device for supporting new command input scheme and method of operating the same

SAMSUNG ELECTRONICS CO LTD0 citations61

US11664061B2May 30, 2023

Memory devices including processing elements, and memory systems including memory devices

SAMSUNG ELECTRONICS CO LTD0 citations61

US12001699B2Jun 4, 2024

Memory device performing configurable mode setting and method of operating the same

SAMSUNG ELECTRONICS CO LTD0 citations60

US11561711B2Jan 24, 2023

Memory device performing configurable mode setting and method of operating the same

SAMSUNG ELECTRONICS CO LTD1 citations60

US9348679B2May 24, 2016

DRAM controller having DRAM bad page management function and bad page management method thereof

SAMSUNG ELECTRONICS CO LTD2 citations60

US12373285B2Jul 29, 2025

Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same

SAMSUNG ELECTRONICS CO LTD0 citations59

US12117901B2Oct 15, 2024

Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same

SAMSUNG ELECTRONICS CO LTD0 citations59

US10784184B2Sep 22, 2020

YOUN JAEYOUN

Patents

Memory device for supporting new command input scheme and method of operating the same

Semiconductor memory devices and memory systems

Memory device including processing circuit, and electronic device including system on chip and memory device

Memory device for supporting new command input scheme and method of operating the same

Memory device for supporting new command input scheme and method of operating the same

Memory devices including processing elements, and memory systems including memory devices

Test method of semiconductor memory device and semiconductor memory system transferring fail address data from a volatile to a non-volatile memory array using an error-correction code engine

Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same

Memory device including processing circuit, and electronic device including system on chip and memory device

Memory device, a controller for controlling the same, a memory system including the same, and a method of operating the same

Memory device including processing circuit, and electronic device including system on chip and memory device

Neuromorphic device based on memory

Memory device, a controller for controlling the same, a memory system including the same, and a method of operating the same

High bandwidth memories and systems including the same

Memory device for supporting new command input scheme and method of operating the same

Memory devices including processing elements, and memory systems including memory devices

Memory device performing configurable mode setting and method of operating the same

Memory device performing configurable mode setting and method of operating the same

DRAM controller having DRAM bad page management function and bad page management method thereof

Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same

Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same

Semiconductor device including through silicon vias distributing current

Memory device comprising status circuit and operating method thereof

Memory device and method reading data

Semiconductor memory devices