Inventor
TOKAR ALEX
IL7 patents
⚠️ This page may combine multiple inventors who share the name “TOKAR ALEX”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JORDAN VALLEY SEMICONDUCTORS
4 patentsUS7649978B2Jan 19, 2010
Automated selection of X-ray reflectometry measurement locations
JORDAN VALLEY SEMICONDUCTORS7 citations71
US9389192B2Jul 12, 2016
Estimation of XRF intensity from an array of micro-bumps
JORDAN VALLEY SEMICONDUCTORS2 citations61
US7321652B2Jan 22, 2008
Multi-detector EDXRD
JORDAN VALLEY SEMICONDUCTORS4 citations61
US9390984B2Jul 12, 2016
X-ray inspection of bumps on a semiconductor substrate
JORDAN VALLEY SEMICONDUCTORS0 citations41
JORDAN VALLEY SEMICONDUCTORS LTD
2 patentsUS9829448B2Nov 28, 2017
Measurement of small features using XRF
JORDAN VALLEY SEMICONDUCTORS LTD8 citations82
US9632043B2Apr 25, 2017
Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF
JORDAN VALLEY SEMICONDUCTORS LTD7 citations75