Inventor

SCHÖNLEBER MARTIN

DE13 patents

⚠️ This page may combine multiple inventors who share the name “SCHÖNLEBER MARTIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PRECITEC OPTRONIK GMBH

9 patents

US8982339B2Mar 17, 2015

Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring head

PRECITEC OPTRONIK GMBH7 citations80

US9677871B2Jun 13, 2017

Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring head

PRECITEC OPTRONIK GMBH10 citations80

US10260941B2Apr 16, 2019

Chromatic confocal distance sensor

PRECITEC OPTRONIK GMBH3 citations67

US10234265B2Mar 19, 2019

Distance measuring device and method for measuring distances

PRECITEC OPTRONIK GMBH6 citations64

US11219967B2Jan 11, 2022

Machining head for a laser machining device

PRECITEC OPTRONIK GMBH0 citations60

US11027364B2Jun 8, 2021

Method and device for measuring the depth of the vapor capillary during a machining process with a high-energy beam

PRECITEC OPTRONIK GMBH0 citations50

PRECITEC GMBH & CO KG

2 patents

US10444521B2Oct 15, 2019

Device for machining material by means of laser radiation

PRECITEC GMBH & CO KG9 citations83

US11079218B2Aug 3, 2021

Measuring distance using a laser processing system with optical amplifier for amplifying measuring beam or reflected part of measurement beam

PRECITEC GMBH & CO KG1 citations59

SCHÖNLEBER MARTIN

2 patents

US9297645B2Mar 29, 2016

Apparatus and method for determining a depth of a region having a high aspect ratio that protrudes into a surface of a semiconductor wafer

SCHÖNLEBER MARTIN11 citations81

US9494409B2Nov 15, 2016

Test device for testing a bonding layer between wafer-shaped samples and test process for testing the bonding layer

SCHÖNLEBER MARTIN15 citations80

SCHÖNLEBER MARTIN

PRECITEC OPTRONIK GMBH

Material-working device with in-situ measurement of the working distance

Device and method for optically measuring a measurement object

Phosphor light source for CLS or multipoint

Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring head

Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring head

Chromatic confocal distance sensor

Distance measuring device and method for measuring distances

Machining head for a laser machining device

Method and device for measuring the depth of the vapor capillary during a machining process with a high-energy beam

PRECITEC GMBH & CO KG

Device for machining material by means of laser radiation

Measuring distance using a laser processing system with optical amplifier for amplifying measuring beam or reflected part of measurement beam

SCHÖNLEBER MARTIN

Apparatus and method for determining a depth of a region having a high aspect ratio that protrudes into a surface of a semiconductor wafer

Test device for testing a bonding layer between wafer-shaped samples and test process for testing the bonding layer