P

Inventor

ESTEVE ROMAIN

DE49 patents
⚠️ This page may combine multiple inventors who share the name “ESTEVE ROMAIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INFINEON TECHNOLOGIES AG

42 patents
US9837527B2Dec 5, 2017

Semiconductor device with a trench electrode

INFINEON TECHNOLOGIES AG22 citations94
US9478655B2Oct 25, 2016

Semiconductor device having a lower diode region arranged below a trench

INFINEON TECHNOLOGIES AG28 citations94
US9577073B2Feb 21, 2017

Method of forming a silicon-carbide device with a shielded gate

INFINEON TECHNOLOGIES AG19 citations92
US10700192B2Jun 30, 2020

Semiconductor device having a source electrode contact trench

INFINEON TECHNOLOGIES AG7 citations84
US10074741B2Sep 11, 2018

Semiconductor device with trench gate structure including a gate electrode and a contact structure for a diode region

INFINEON TECHNOLOGIES AG10 citations84
US10038087B2Jul 31, 2018

Semiconductor device and transistor cell having a diode region

INFINEON TECHNOLOGIES AG4 citations84
US9997515B2Jun 12, 2018

Semiconductor devices with trench gate structures in a semiconductor body with hexagonal crystal lattice

INFINEON TECHNOLOGIES AG6 citations84
US9741712B2Aug 22, 2017

Semiconductor devices with trench gate structures in a semiconductor body with hexagonal crystal lattice

INFINEON TECHNOLOGIES AG8 citations84
US10211306B2Feb 19, 2019

Semiconductor device with diode region and trench gate structure

INFINEON TECHNOLOGIES AG15 citations83
US10586845B1Mar 10, 2020

SiC trench transistor device and methods of manufacturing thereof

INFINEON TECHNOLOGIES AG9 citations82
US10727330B2Jul 28, 2020

Semiconductor device with diode region

INFINEON TECHNOLOGIES AG2 citations73
US9876103B2Jan 23, 2018

Semiconductor device and transistor cell having a diode region

INFINEON TECHNOLOGIES AG2 citations73
US9818818B2Nov 14, 2017

Power semiconductor device including trench gate structures with longitudinal axes tilted to a main crystal direction

INFINEON TECHNOLOGIES AG6 citations73
US10700182B2Jun 30, 2020

Semiconductor device with transistor cells and a drift structure and method of manufacturing

INFINEON TECHNOLOGIES AG2 citations72
US10217636B2Feb 26, 2019

Method of manufacturing a silicon carbide semiconductor device by removing amorphized portions

INFINEON TECHNOLOGIES AG2 citations69
US10964808B2Mar 30, 2021

Silicon carbide semiconductor device with trench gate structure and vertical PN junction between body region and drift structure

INFINEON TECHNOLOGIES AG0 citations63
US11881512B2Jan 23, 2024

Method of manufacturing semiconductor device with silicon carbide body

INFINEON TECHNOLOGIES AG0 citations62
US11764063B2Sep 19, 2023

Silicon carbide device with compensation region and method of manufacturing

INFINEON TECHNOLOGIES AG0 citations62
US11626477B2Apr 11, 2023

Silicon carbide field-effect transistor including shielding areas

INFINEON TECHNOLOGIES AG0 citations62
US11195946B2Dec 7, 2021

Method of manufacturing a silicon carbide semiconductor device with trench gate structure and vertical pn junction between body region and drift structure

INFINEON TECHNOLOGIES AG0 citations62
US11195921B2Dec 7, 2021

Semiconductor device with silicon carbide body

INFINEON TECHNOLOGIES AG0 citations62
US11101343B2Aug 24, 2021

Silicon carbide field-effect transistor including shielding areas

INFINEON TECHNOLOGIES AG0 citations62
US10985248B2Apr 20, 2021

SiC power semiconductor device with integrated Schottky junction

INFINEON TECHNOLOGIES AG1 citations62
US10915029B2Feb 9, 2021

Particle irradiation apparatus, beam modifier device, and semiconductor device including a junction termination extension zone

INFINEON TECHNOLOGIES AG0 citations62
US10553685B2Feb 4, 2020

SiC semiconductor device with offset in trench bottom

INFINEON TECHNOLOGIES AG1 citations62
US9029974B2May 12, 2015

Semiconductor device, junction field effect transistor and vertical field effect transistor

INFINEON TECHNOLOGIES AG3 citations62
US11462611B2Oct 4, 2022

SiC device with channel regions extending along at least one of the (1-100) plane and the (-1100) plane and methods of manufacturing thereof

INFINEON TECHNOLOGIES AG0 citations61
US10896952B2Jan 19, 2021

SiC device and methods of manufacturing thereof

INFINEON TECHNOLOGIES AG0 citations61
US10256097B2Apr 9, 2019

Forming a metal contact layer on silicon carbide and semiconductor device with metal contact structure

INFINEON TECHNOLOGIES AG1 citations61
US11380756B2Jul 5, 2022

Silicon carbide device with Schottky contact

INFINEON TECHNOLOGIES AG0 citations60
US11842938B2Dec 12, 2023

Semiconductor device and method for forming a semiconductor device

INFINEON TECHNOLOGIES AG0 citations59
US11217500B2Jan 4, 2022

Semiconductor device and method for forming a semiconductor device

INFINEON TECHNOLOGIES AG0 citations59
US11552172B2Jan 10, 2023

Silicon carbide device with compensation layer and method of manufacturing

INFINEON TECHNOLOGIES AG0 citations52
US10734514B2Aug 4, 2020

Semiconductor device with trench gate structure including a gate electrode and a contact structure for a diode region

INFINEON TECHNOLOGIES AG0 citations52
US10580878B1Mar 3, 2020

SiC device with buried doped region

INFINEON TECHNOLOGIES AG0 citations52
US10361192B2Jul 23, 2019

Semiconductor devices with trench gate structures in a semiconductor body with hexagonal crystal lattice

INFINEON TECHNOLOGIES AG0 citations52
US10120287B2Nov 6, 2018

Particle irradiation apparatus, beam modifier device, and semiconductor device including a junction termination extension zone

INFINEON TECHNOLOGIES AG0 citations52
US9960230B2May 1, 2018

Silicon-carbide transistor device with a shielded gate

INFINEON TECHNOLOGIES AG1 citations52
US10049879B2Aug 14, 2018

Self aligned silicon carbide contact formation using protective layer

INFINEON TECHNOLOGIES AG0 citations49
US9666482B1May 30, 2017

Self aligned silicon carbide contact formation using protective layer

INFINEON TECHNOLOGIES AG0 citations49
US9934972B2Apr 3, 2018

Method of manufacturing a silicon carbide semiconductor device by removing amorphized portions

INFINEON TECHNOLOGIES AG0 citations48
US9917170B2Mar 13, 2018

Carbon based contact structure for silicon carbide device technical field

INFINEON TECHNOLOGIES AG0 citations40

INFINEON TECHNOLOGIES AUSTRIA AG

4 patents

INFINEON TECHNOLOGIES AUSTRIA

2 patents

Nexperia BV

1 patent