Inventor · disambiguated record
Hisashi Yamauchi
Also filed as: YAMAUCHI HISASHI
25 granted patents·5 pending applications·124 citations·filing 1979–2022
95Inventor score
Top patents by PatentIndex Score
30 records- 0192US9946188B2Image forming apparatusCANON KK·Filed 2017·Granted Apr 17, 2018·4 cites·23 claims
- 0289US10444658B2Image forming apparatus having developer transporting member that transports developer toward a developer bearing memberCANON KK·Filed 2018·Granted Oct 15, 2019·2 cites·5 claims
- 0384US10754265B2Image forming apparatusCANON KK·Filed 2019·Granted Aug 25, 2020·2 cites·9 claims
- 0479US4287541ACassette loading device for a cassette recording apparatusSONY CORP·Filed 1979·Granted Sep 1, 1981·19 cites·12 claims
- 0577US11635705B2Image forming apparatus having developer transporting member that transports developer toward a developer bearing memberCANON KK·Filed 2022·Granted Apr 25, 2023·0 cites·6 claims
- 0677US8472823B2Image forming apparatus featuring a control device for controlling a developer discharge operation in first and second modesOKUBO KAZUHIRO·Filed 2010·Granted Jun 25, 2013·3 cites·13 claims
- 0776US8116668B2Toner supplying roller, developing apparatus, and image forming apparatusKOYANAGI MASATO·Filed 2009·Granted Feb 14, 2012·6 cites·7 claims
- 0872US10802418B2Image forming apparatus having developer transporting member that transports developer toward a developer bearing memberCANON KK·Filed 2019·Granted Oct 13, 2020·0 cites·14 claims
- 0972US8718499B2Image forming apparatusCANON KK·Filed 2013·Granted May 6, 2014·1 cites·14 claims
- 1072US6328787B1Apparatus and method for treating gas using a honeycomb rotor having a plurality of desorbing zonesSEIBU GIKEN KK·Filed 1999·Granted Dec 11, 2001·37 cites·16 claims
- 1171US11327415B2Image forming apparatus having developer transporting member that transports developer toward a developer bearing memberCANON KK·Filed 2020·Granted May 10, 2022·0 cites·8 claims
- 1269US7562256B2Semiconductor memory device for build-in fault diagnosisNEC ELECTRONICS CORP·Filed 2005·Granted Jul 14, 2009·7 cites·20 claims
- 1367US8428477B2Image forming apparatusSHIBATA MASAHIRO·Filed 2010·Granted Apr 23, 2013·1 cites·8 claims
- 1464US8238177B2Integrated circuitYAMAUCHI HISASHI·Filed 2010·Granted Aug 7, 2012·4 cites·7 claims
- 1555US10520852B2Image forming apparatusCANON KK·Filed 2018·Granted Dec 31, 2019·0 cites·12 claims
- 1653US10466634B2Image forming apparatus including developer carrying memberCANON KK·Filed 2018·Granted Nov 5, 2019·0 cites·18 claims
- 1748US7024606B2Method of generating test pattern for integrated circuitNEC ELECTRONICS CORP·Filed 2003·Granted Apr 4, 2006·3 cites·4 claims
- 1847US9507314B2Image forming apparatusCANON KK·Filed 2015·Granted Nov 29, 2016·0 cites·18 claims
- 1946US11073781B2Image forming apparatus that suppresses occurrence of image smearing by maintaining a metal soap on a surface of a photoconductorCANON KK·Filed 2020·Granted Jul 27, 2021·0 cites·74 claims
- 2045US2015125166A1Developer container, developing apparatus, process cartridge and image forming apparatusCANON KK·Filed 2014·Application pending·0 cites
- 2143US2014186062A1Developer container unit, developing unit, and process cartridgeCANON KK·Filed 2013·Application pending·0 cites
- 2242US6574169B1Delay test system for normal circuitNEC ELECTRONICS CORP·Filed 2000·Granted Jun 3, 2003·1 cites·9 claims
- 2341US6105156ALSI tester for use in LSI fault analysisNEC CORP·Filed 1998·Granted Aug 15, 2000·9 cites·20 claims
- 2440US5467354ATest control circuit for controlling a setting and resetting of a flipflopNEC CORP·Filed 1993·Granted Nov 14, 1995·12 cites·4 claims
- 2539US7475300B2Test circuit and test methodNEC ELECTRONICS CORP·Filed 2006·Granted Jan 6, 2009·0 cites·16 claims
- 2637US2005235184A1Semiconductor integrated circuit device and test method thereofNEC ELECTRONICS CORP·Filed 2005·Application pending·0 cites
- 2735US2002199144A1Scan path test methodFiled 2002·Application pending·0 cites
- 2834US6128253ADelay test system for normal circuitNEC CORP·Filed 1998·Granted Oct 3, 2000·4 cites·3 claims
- 2933US5939894ACMOS integrated circuit testing method and apparatus using quiescent power supply currents databaseNEC CORP·Filed 1996·Granted Aug 17, 1999·9 cites·9 claims
- 3029US2002046376A1Method of generating test pattern for integrated circuitFiled 1999·Application pending·0 cites
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