Inventor
WALDEN II FRANKLIN STAMPLEY
US30 patents
Patents
30 patentsUSD806892SJan 2, 2018
Tip of a sample holder
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USD841183SFeb 19, 2019
Window E-chip for an electron microscope
PROTOCHIPS INC25 citations93
US9466459B2Oct 11, 2016
Method for optimizing fluid flow across a sample within an electron microscope sample holder
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US9437393B2Sep 6, 2016
Method for forming an electrical connection to an sample support in an electron microscope holder
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US10373800B2Aug 6, 2019
Method for optimizing fluid flow across a sample within an electron microscope sample holder
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US10014154B2Jul 3, 2018
Method for enabling modular part replacement within an electron microscope sample holder
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US10986279B1Apr 20, 2021
Automated application of drift correction to sample studied under electron microscope
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US9818578B2Nov 14, 2017
Device for monitoring environmental states of a microscope sample with an electron microscope sample holder
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US12130858B2Oct 29, 2024
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
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US11902665B2Feb 13, 2024
Automated application of drift correction to sample studied under electron microscope
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US11869744B2Jan 9, 2024
Electron microscope sample holder fluid handling with independent pressure and flow control
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US11222765B2Jan 11, 2022
Electron microscope sample holder fluid handling with independent pressure and flow control
PROTOCHIPS INC0 citations62
US11170968B2Nov 9, 2021
MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples
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US10128079B2Nov 13, 2018
MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples
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US12375815B2Jul 29, 2025
Automated application of drift correction to sample studied under electron microscope
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US12010430B2Jun 11, 2024
Automated application of drift correction to sample studied under electron microscope
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US11477388B2Oct 18, 2022
Automated application of drift correction to sample studied under electron microscope
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US11399138B2Jul 26, 2022
Automated application of drift correction to sample studied under electron microscope
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US11755639B2Sep 12, 2023
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
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US11455333B1Sep 27, 2022
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
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US12284445B2Apr 22, 2025
Automated application of drift correction to sample studied under electron microscope
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US11514586B1Nov 29, 2022
Automated application of drift correction to sample studied under electron microscope
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US10586679B2Mar 10, 2020
Method for enabling modular part replacement within an electron microscope sample holder
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US9997330B2Jun 12, 2018
Method for optimizing fluid flow across a sample within an electron microscope sample holder
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US10777380B2Sep 15, 2020
MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples
PROTOCHIPS INC0 citations51
US10460906B2Oct 29, 2019
Method for monitoring environmental states of a microscope sample with an electron microscope sample holder
PROTOCHIPS INC0 citations51
US10446363B2Oct 15, 2019
MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples
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US10256563B2Apr 9, 2019
Method for forming an electrical connection to a sample support in an electron microscope holder
PROTOCHIPS INC0 citations51
US10503127B2Dec 10, 2019
Method for safe control of gas delivery to an electron microscope sample holder
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US9915926B2Mar 13, 2018
Method for safe control of gas delivery to an electron microscope sample holder
PROTOCHIPS INC0 citations48