Inventor
FRANKS ALAN PHILIP
US11 patents
Patents
11 patentsUS10986279B1Apr 20, 2021
Automated application of drift correction to sample studied under electron microscope
PROTOCHIPS INC2 citations72
US12130858B2Oct 29, 2024
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
PROTOCHIPS INC1 citations71
US11902665B2Feb 13, 2024
Automated application of drift correction to sample studied under electron microscope
PROTOCHIPS INC4 citations71
US12375815B2Jul 29, 2025
Automated application of drift correction to sample studied under electron microscope
PROTOCHIPS INC0 citations61
US12010430B2Jun 11, 2024
Automated application of drift correction to sample studied under electron microscope
PROTOCHIPS INC0 citations61
US11477388B2Oct 18, 2022
Automated application of drift correction to sample studied under electron microscope
PROTOCHIPS INC0 citations61
US11399138B2Jul 26, 2022
Automated application of drift correction to sample studied under electron microscope
PROTOCHIPS INC0 citations61
US11755639B2Sep 12, 2023
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
PROTOCHIPS INC0 citations60
US11455333B1Sep 27, 2022
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
PROTOCHIPS INC0 citations60
US12284445B2Apr 22, 2025
Automated application of drift correction to sample studied under electron microscope
PROTOCHIPS INC0 citations59
US11514586B1Nov 29, 2022
Automated application of drift correction to sample studied under electron microscope
PROTOCHIPS INC0 citations59