Inventor
KIM KWANGEUN
KR5 patents
⚠️ This page may combine multiple inventors who share the name “KIM KWANGEUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
4 patentsUS12385946B2Aug 12, 2025
Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations58
US12362138B2Jul 15, 2025
Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations47
US12092656B2Sep 17, 2024
Test apparatus and test method thereof
SAMSUNG ELECTRONICS CO LTD0 citations47
US11428645B2Aug 30, 2022
Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection device
SAMSUNG ELECTRONICS CO LTD0 citations36