Inventor
HIDAKA KAZUHIKO
JP39 patents
⚠️ This page may combine multiple inventors who share the name “HIDAKA KAZUHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITUTOYO CORP
37 patentsUS7100429B2Sep 5, 2006
Surface profile measuring instrument and surface profile measuring method
MITUTOYO CORP23 citations92
US6604295B2Aug 12, 2003
Microscopic geometry measuring device
MITUTOYO CORP35 citations92
US6484571B1Nov 26, 2002
Surface configuration measuring method
MITUTOYO CORP24 citations92
US6457366B1Oct 1, 2002
Movement control mechanism of contact-type vibrating probe
MITUTOYO CORP26 citations92
US6307084B1Oct 23, 2001
Contact location detecting mechanism of touch signal probe
MITUTOYO CORP31 citations92
US5756886AMay 26, 1998
Touch probe with reseat position system
MITUTOYO CORP30 citations92
US10914570B2Feb 9, 2021
Inductive position detection configuration for indicating a measurement device stylus position
MITUTOYO CORP15 citations85
US9810529B2Nov 7, 2017
Measuring probe for measuring a three-dimensional shape of an object to be measured
MITUTOYO CORP8 citations84
US9618312B2Apr 11, 2017
Measuring probe
MITUTOYO CORP17 citations84
US9605943B2Mar 28, 2017
Measuring probe
MITUTOYO CORP9 citations84
US9285201B2Mar 15, 2016
Form measuring instrument
MITUTOYO CORP18 citations84
US9062958B2Jun 23, 2015
Image sensor, attitude detector, contact probe, and multi-sensing probe
MITUTOYO CORP7 citations84
US8665435B2Mar 4, 2014
Wavelength detector and contact probe using it
MITUTOYO CORP16 citations84
US7319528B2Jan 15, 2008
Surface texture measuring instrument
MITUTOYO CORP11 citations84
US6516529B2Feb 11, 2003
Touch signal probe
MITUTOYO CORP17 citations83
US6327789B1Dec 11, 2001
Touch signal probe
MITUTOYO CORP16 citations83
US9528824B2Dec 27, 2016
Tactile probing system
MITUTOYO CORP15 citations76
US6848315B2Feb 1, 2005
Vibration detecting system of resilient body and vibrating contact detection probe
MITUTOYO CORP9 citations74
US10900765B2Jan 26, 2021
Form measuring apparatus
MITUTOYO CORP2 citations73
US10422628B2Sep 24, 2019
Measuring probe
MITUTOYO CORP4 citations73
US9869537B2Jan 16, 2018
Contact probe
MITUTOYO CORP3 citations73
US9518811B2Dec 13, 2016
Form measuring machine
MITUTOYO CORP3 citations73
US9303968B2Apr 5, 2016
Lever type measuring machine
MITUTOYO CORP3 citations73
US6516669B2Feb 11, 2003
Vibration-type contact detection sensor
MITUTOYO CORP7 citations73
US12315266B2May 27, 2025
Position detection system, position detection method, and three-dimensional geometry measurement system
MITUTOYO CORP0 citations57
US8345260B2Jan 1, 2013
Method of detecting a movement of a measuring probe and measuring instrument
MITUTOYO CORP2 citations56
US11092422B2Aug 17, 2021
Measuring apparatus and measuring method
MITUTOYO CORP0 citations52
US10001358B2Jun 19, 2018
Measuring probe and measuring probe system
MITUTOYO CORP0 citations52
US9163917B2Oct 20, 2015
Lever head
MITUTOYO CORP1 citations52
US7581438B2Sep 1, 2009
Surface texture measuring probe and microscope utilizing the same
MITUTOYO CORP1 citations52
US11435560B2Sep 6, 2022
Lens substrate stacking position calculating apparatus and program
MITUTOYO CORP0 citations50
US12078478B2Sep 3, 2024
Measurement apparatus, control apparatus, and control method
MITUTOYO CORP0 citations49
US10161743B2Dec 25, 2018
Measuring probe and measuring probe system
MITUTOYO CORP0 citations42
US10113931B2Oct 30, 2018
Probe measuring force adjuster
MITUTOYO CORP0 citations42
US7642503B2Jan 5, 2010
Method to determine a control parameter in a measurement control system
MITUTOYO CORP0 citations42
US10415947B2Sep 17, 2019
Measurement probe and measuring device
MITUTOYO CORP0 citations41
US10788312B2Sep 29, 2020
Coordinate measuring unit and method for recognizing measuring probe
MITUTOYO CORP0 citations33