Inventor

WANG CHANGTING

US21 patents

⚠️ This page may combine multiple inventors who share the name “WANG CHANGTING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WANG CHANGTING

GEN ELECTRIC

Method and apparatus for optimized centralized critical control architecture for switchgear and power equipment

Omnidirectional eddy current probe and inspection system

Method and apparatus for node electronics unit architecture

Pulsed eddy current pipeline inspection system and method

Omnidirectional eddy current array probes and methods of use

Flexible eddy current array probe and methods of assembling the same

Inspection of non-planar parts using multifrequency eddy current with phase analysis

Inspection method and system using multifrequency phase analysis

Methods and apparatus for inspection utilizing pulsed eddy current

Magnetic inspection systems for inspection of target objects

Multi-frequency image processing for inspecting parts having complex geometric shapes

Eddy current probe and inspection method

Method for non-destructive testing of composite systems

System and method for inspection of parts with an eddy current probe

Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same

WANG CHANGTING

Eddy current array probe

System and method for eddy current inspection of parts with complex geometries

WU YANYAN

Method and system for integrating eddy current inspection with a coordinate measuring device

SUN HAIYAN

Eddy current inspection system and method

MAY ANDRZEJ MICHAL

Drive coil, measurement probe comprising the drive coil and methods utilizing the measurement probe

HUAWEI TECH CO LTD

Method and apparatus for acquiring resource