Inventor
SUH UI
US4 patents
Patents
4 patentsUS7952348B2May 31, 2011
Flexible eddy current array probe and methods of assembling the same
GEN ELECTRIC8 citations82
US7518359B2Apr 14, 2009
Inspection of non-planar parts using multifrequency eddy current with phase analysis
GEN ELECTRIC8 citations82
US7206706B2Apr 17, 2007
Inspection method and system using multifrequency phase analysis
GEN ELECTRIC18 citations79
US7888932B2Feb 15, 2011
Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same
GEN ELECTRIC3 citations60