Inventor

FLOREK STEFAN

DE14 patents

⚠️ This page may combine multiple inventors who share the name “FLOREK STEFAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ZENTRALINSTITUT FUER OPTIK UND

2 patents

US5189486AFeb 23, 1993

Echelle polychromator

ZENTRALINSTITUT FUER OPTIK UND22 citations90

US5182609AJan 26, 1993

Spectrometer

ZENTRALINSTITUT FUER OPTIK UND12 citations68

JENOPTIK JENA GMBH

2 patents

US4690559ASep 1, 1987

Optical system for spectral analysis devices

JENOPTIK JENA GMBH13 citations72

US4856898AAug 15, 1989

Adjustable echelle spectrometer arrangement and method for its adjustment

JENOPTIK JENA GMBH18 citations68

GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV

2 patents

US7319519B2Jan 15, 2008

Method for the analysis of echelle spectra

GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV6 citations70

US7215422B2May 8, 2007

Assembly and method for wavelength calibration in an echelle spectrometer

GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV5 citations60

LEIBNIZ INST FUR ANALYTISCHE WISSENSCHAFTEN ISAS E V

1 patent

US7876435B2Jan 25, 2011

Method for determining background and correction of broadband background

LEIBNIZ INST FUR ANALYTISCHE WISSENSCHAFTEN ISAS E V33 citations88

BODENSEEWERK PERKIN ELMER CO

1 patent

US5448351ASep 5, 1995

Echelle polychromator

BODENSEEWERK PERKIN ELMER CO11 citations73

AKAD WISSENSCHAFTEN DDR

1 patent

US4940325AJul 10, 1990

Device for the investigation of highly resolved partial spectra of an echelle spectrum

AKAD WISSENSCHAFTEN DDR14 citations65

GES FOERDERUNG SPEKTROCHEMIE

1 patent

US6717670B2Apr 6, 2004

High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile

GES FOERDERUNG SPEKTROCHEMIE2 citations59

LEIBNIZ INST FUR ANALYTISCHE W

1 patent

US7804593B2Sep 28, 2010

Echelle spectometer with improved use of the detector by means of two spectrometer arrangements

LEIBNIZ INST FUR ANALYTISCHE W5 citations49

FLOREK STEFAN

1 patent

US8873048B2Oct 28, 2014

Spectrometer arrangement

FLOREK STEFAN1 citations44

BECKER-ROSS HELMUT

1 patent

US8102527B2Jan 24, 2012

Spectrometer assembly

BECKER-ROSS HELMUT0 citations44

BECKER-ROΒ HELMUT

1 patent

US8681329B2Mar 25, 2014

Echelle spectrometer arrangement using internal predispersion

BECKER-ROΒ HELMUT1 citations41