P

Inventor

TARUI YOICHIRO

JP43 patents
⚠️ This page may combine multiple inventors who share the name “TARUI YOICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

28 patents
US6307232B1Oct 23, 2001

Semiconductor device having lateral high breakdown voltage element

MITSUBISHI ELECTRIC CORP115 citations98
US7919403B2Apr 5, 2011

Method of manufacturing silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP7 citations84
US7285465B2Oct 23, 2007

Method of manufacturing a SiC vertical MOSFET

MITSUBISHI ELECTRIC CORP10 citations83
US7029969B2Apr 18, 2006

Method of manufacture of a silicon carbide MOSFET including a masking with a tapered shape and implanting ions at an angle

MITSUBISHI ELECTRIC CORP7 citations72
US9627571B2Apr 18, 2017

Semiconductor device

MITSUBISHI ELECTRIC CORP3 citations71
US9184307B2Nov 10, 2015

Silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP3 citations62
US9324806B2Apr 26, 2016

Silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP2 citations61
US8026160B2Sep 27, 2011

Semiconductor device and semiconductor device manufacturing method

MITSUBISHI ELECTRIC CORP2 citations61
US9455197B2Sep 27, 2016

Method for manufacturing silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP2 citations60
US8932944B2Jan 13, 2015

Silicon carbide semiconductor device manufacturing method

MITSUBISHI ELECTRIC CORP2 citations60
US12477789B2Nov 18, 2025

Semiconductor device having a plurality of pillars and method of manufacturing the semiconductor device

MITSUBISHI ELECTRIC CORP0 citations52
US9276068B2Mar 1, 2016

Manufacturing method of silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP0 citations52
US8350353B2Jan 8, 2013

Method of manufacturing silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP1 citations52
US7939943B2May 10, 2011

Nitride semiconductor device including an electrode in ohmic contact with a P-type nitride semiconductor contact layer

MITSUBISHI ELECTRIC CORP1 citations52
US7564072B2Jul 21, 2009

Semiconductor device having junction termination extension

MITSUBISHI ELECTRIC CORP1 citations52
US8987105B2Mar 24, 2015

SiC semiconductor device and method of manufacturing the same

MITSUBISHI ELECTRIC CORP0 citations51
US12094959B2Sep 17, 2024

Semiconductor device and method of manufacturing semiconductor device

MITSUBISHI ELECTRIC CORP0 citations50
US10665713B2May 26, 2020

Silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP0 citations50
US9935170B2Apr 3, 2018

Silicon carbide semiconductor device and method for manufacturing same

MITSUBISHI ELECTRIC CORP0 citations50
US9842906B2Dec 12, 2017

Semiconductor device

MITSUBISHI ELECTRIC CORP1 citations50
US11125803B2Sep 21, 2021

Method of measuring semiconductor device by applying voltage to the semiconductor device using probe needle

MITSUBISHI ELECTRIC CORP0 citations49
US11094790B2Aug 17, 2021

Silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP0 citations49
US10128340B2Nov 13, 2018

Power semiconductor device

MITSUBISHI ELECTRIC CORP0 citations49
US9748393B2Aug 29, 2017

Silicon carbide semiconductor device with a trench

MITSUBISHI ELECTRIC CORP0 citations42
US9985124B2May 29, 2018

Silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP0 citations40
US9184306B2Nov 10, 2015

Silicon carbide semiconductor device

MITSUBISHI ELECTRIC CORP0 citations40
US7678597B2Mar 16, 2010

Method of manufacturing semiconductor device including gallium-nitride semiconductor structure and a palladium contact

MITSUBISHI ELECTRIC CORP0 citations39
US9159585B2Oct 13, 2015

Method of manufacturing semiconductor device

MITSUBISHI ELECTRIC CORP0 citations36

TARUI YOICHIRO

8 patents

OKUNO KOJI

1 patent

SUEKAWA EISUKE

1 patent

MATSUNO YOSHINORI

1 patent

ORITSUKI YASUNORI

1 patent

UDA YUKIO

1 patent

TSUCHIYA NORIAKI

1 patent

WATANABE TOMOKATSU

1 patent