Inventor
LIU YOW-JUANG BILL
US21 patents
⚠️ This page may combine multiple inventors who share the name “LIU YOW-JUANG BILL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ALTERA CORP
15 patentsUS7772591B1Aug 10, 2010
Electrically-programmable transistor antifuses
ALTERA CORP41 citations92
US7470630B1Dec 30, 2008
Approach to reduce parasitic capacitance from dummy fill
ALTERA CORP22 citations92
US7210115B1Apr 24, 2007
Methods for optimizing programmable logic device performance by reducing congestion
ALTERA CORP33 citations92
US7408754B1Aug 5, 2008
Fast trigger ESD device for protection of integrated circuits
ALTERA CORP26 citations89
US7671416B1Mar 2, 2010
Method and device for electrostatic discharge protection
ALTERA CORP14 citations84
US7638847B1Dec 29, 2009
ESD protection structure
ALTERA CORP12 citations84
US7326998B1Feb 5, 2008
Effective I/O ESD protection device for high performance circuits
ALTERA CORP17 citations84
US7981753B1Jul 19, 2011
Method and device for electrostatic discharge protection
ALTERA CORP4 citations62
US7511533B1Mar 31, 2009
Output device having parasitic transistor for increased current drive
ALTERA CORP3 citations62
US7279952B1Oct 9, 2007
Voltage clamp circuit with reduced I/O capacitance
ALTERA CORP2 citations62
US7170810B1Jan 30, 2007
Stable programming circuitry for programmable integrated circuits
ALTERA CORP5 citations62
US6829127B1Dec 7, 2004
High performance capacitor structure
ALTERA CORP4 citations61
US7361961B2Apr 22, 2008
Method and apparatus with varying gate oxide thickness
ALTERA CORP0 citations52
US7333312B2Feb 19, 2008
ESD device with low trigger voltage and low leakage
ALTERA CORP0 citations52
US7045427B2May 16, 2006
Polysilicon gate doping level variation for reduced leakage current
ALTERA CORP0 citations49
ADVANCED MICRO DEVICES INC
3 patentsUS5257095AOct 26, 1993
Common geometry high voltage tolerant long channel and high speed short channel field effect transistors
ADVANCED MICRO DEVICES INC23 citations89
US4709467ADec 1, 1987
Non-selective implantation process for forming contact regions in integrated circuits
ADVANCED MICRO DEVICES INC11 citations73
US5010029AApr 23, 1991
Method of detecting the width of spacers and lightly doped drain regions
ADVANCED MICRO DEVICES INC10 citations71