Inventor
TORAYA HIDEO
JP12 patents
⚠️ This page may combine multiple inventors who share the name “TORAYA HIDEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RIGAKU DENKI CO LTD
9 patentsUS7801272B2Sep 21, 2010
X-ray diffraction apparatus and X-ray diffraction method
RIGAKU DENKI CO LTD24 citations91
US6873681B2Mar 29, 2005
Method of estimating preferred orientation of polycrystalline material
RIGAKU DENKI CO LTD12 citations83
US12031927B2Jul 9, 2024
Method and device for analyzing diffraction pattern of mixture, and information storage medium
RIGAKU DENKI CO LTD1 citations61
US11852597B2Dec 26, 2023
Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium
RIGAKU DENKI CO LTD1 citations61
US10962489B2Mar 30, 2021
Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program
RIGAKU DENKI CO LTD1 citations60
US11841334B2Dec 12, 2023
Quantitative phase analysis device, quantitative phase analysis method, and non-transitory computer-readable storage medium storing quantitative phase analysis program
RIGAKU DENKI CO LTD1 citations55
US11402341B2Aug 2, 2022
Quantitative phase analysis device for analyzing non-crystalline phases, quantitative phase analysis method for analyzing Non-Crystalline phases, and non-transitory computer-readable storage medium storing quantitative phase analysis program for analyzing Non-Crystalline Phases
RIGAKU DENKI CO LTD1 citations55
US12405235B2Sep 2, 2025
Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium
RIGAKU DENKI CO LTD0 citations50
US12287300B2Apr 29, 2025
Device and method for analyzing diffraction pattern of mixture, and information storage medium
RIGAKU DENKI CO LTD0 citations50