Inventor
MCKENNEY SHAWN
US5 patents
Patents
5 patentsUS9423362B2Aug 23, 2016
Primary and secondary scanning in muon tomography inspection
DECISION SCIENCES INT CORP6 citations80
US10067260B2Sep 4, 2018
Data processing structure to enable tomographic imaging with detector arrays using ambient particle flux
DECISION SCIENCES INT CORP2 citations71
US10215717B2Feb 26, 2019
Detection of an object within a volume of interest
DECISION SCIENCES INT CORP4 citations70
US9784859B2Oct 10, 2017
Calibrating modular charged particle detector arrays
DECISION SCIENCES INT CORP4 citations70
US10228486B2Mar 12, 2019
Inspection of objects based on primary and secondary scanning
DECISION SCIENCES INT CORP3 citations69