Inventor
HU SHUIQING
US24 patents
⚠️ This page may combine multiple inventors who share the name “HU SHUIQING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BRUKER NANO INC
20 patentsUS9588136B2Mar 7, 2017
Method and apparatus of operating a scanning probe microscope
BRUKER NANO INC8 citations92
US9322842B2Apr 26, 2016
Method and apparatus of operating a scanning probe microscope
BRUKER NANO INC10 citations92
US9291640B2Mar 22, 2016
Method and apparatus of using peak force tapping mode to measure physical properties of a sample
BRUKER NANO INC9 citations84
US9575090B2Feb 21, 2017
Force measurement with real-time baseline determination
BRUKER NANO INC5 citations83
US8997259B2Mar 31, 2015
Method and apparatus of tuning a scanning probe microscope
BRUKER NANO INC5 citations83
US9213047B2Dec 15, 2015
Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
BRUKER NANO INC7 citations82
US10502761B2Dec 10, 2019
Method and apparatus of operating a scanning probe microscope
BRUKER NANO INC1 citations73
US10197596B2Feb 5, 2019
Method and apparatus of operating a scanning probe microscope
BRUKER NANO INC1 citations73
US9739799B2Aug 22, 2017
Method and apparatus to compensate for deflection artifacts in an atomic force microscope
BRUKER NANO INC2 citations73
US9910064B2Mar 6, 2018
Force measurement with real-time baseline determination
BRUKER NANO INC3 citations72
US9995765B2Jun 12, 2018
Method and apparatus of using peak force tapping mode to measure physical properties of a sample
BRUKER NANO INC1 citations63
US9810713B2Nov 7, 2017
Method and apparatus of operating a scanning probe microscope
BRUKER NANO INC1 citations63
US9274139B2Mar 1, 2016
Method and apparatus of operating a scanning probe microscope
BRUKER NANO INC2 citations63
US11555827B2Jan 17, 2023
Torsion wing probe assembly
BRUKER NANO INC0 citations62
US11119118B2Sep 14, 2021
Torsion wing probe assembly
BRUKER NANO INC0 citations62
US11002757B2May 11, 2021
Method and apparatus of operating a scanning probe microscope
BRUKER NANO INC0 citations62
US10175263B2Jan 8, 2019
Sample vessel retention structure for scanning probe microscope
BRUKER NANO INC1 citations62
US9869694B2Jan 16, 2018
Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
BRUKER NANO INC1 citations61
US10663483B2May 26, 2020
Method and apparatus of using peak force tapping mode to measure physical properties of a sample
BRUKER NANO INC0 citations52
US9116167B2Aug 25, 2015
Method and apparatus of tuning a scanning probe microscope
BRUKER NANO INC0 citations51