Inventor

SU CHANMIN

US52 patents

⚠️ This page may combine multiple inventors who share the name “SU CHANMIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SU CHANMIN

BRUKER NANO INC

Method and apparatus of operating a scanning probe microscope

Method and apparatus of operating a scanning probe microscope

Dual-probe scanning probe microscope

Method and apparatus of using peak force tapping mode to measure physical properties of a sample

Force measurement with real-time baseline determination

Method and apparatus of tuning a scanning probe microscope

Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode

Method and apparatus of physical property measurement using a probe-based nano-localized light source

Method and apparatus of operating a scanning probe microscope

Method and apparatus of operating a scanning probe microscope

Method and apparatus to compensate for deflection artifacts in an atomic force microscope

Force measurement with real-time baseline determination

Infrared characterization of a sample using oscillating mode

Peakforce photothermal-based detection of IR nanoabsorption

PeakForce photothermal-based detection of IR nanoabsorption

Method and apparatus of using peak force tapping mode to measure physical properties of a sample

Method and apparatus of operating a scanning probe microscope

Closed loop controller and method for fast scanning probe microscopy

Dual-probe scanning probe microscope

Method and apparatus of operating a scanning probe microscope

Closed loop controller and method for fast scanning probe microscopy

Torsion wing probe assembly

Torsion wing probe assembly

Method and apparatus of operating a scanning probe microscope

Sample vessel retention structure for scanning probe microscope

Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode

Chemical nano-identification of a sample using normalized near-field spectroscopy

Method and apparatus of using peak force tapping mode to measure physical properties of a sample

Scanning probe microscopy utilizing separable components

Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof

Method and apparatus of tuning a scanning probe microscope

Method and apparatus of physical property measurement using a probe-based nano-localized light source

VEECO INSTR INC

Fast-scanning SPM and method of operating same

Torsional resonance mode probe-based instrument and method

Method and apparatus for measuring electrical properties in torsional resonance mode

Method and apparatus for measuring electrical properties in torsional resonance mode

Thermal mechanical drive actuator, thermal probe and method of thermally driving a probe

Method and apparatus of driving torsional resonance mode of a probe-based instrument

Method and apparatus of driving torsional resonance mode of a probe-based instrument

Method and apparatus of high speed property mapping

Method and apparatus for obtaining quantitative measurements using a probe based instrument

SHI JIAN

Method and apparatus of using peak force tapping mode to measure physical properties of a sample

Closed loop controller and method for fast scanning probe microscopy

HU YAN

Method and apparatus of operating a scanning probe microscope

Method and apparatus of operating a scanning probe microscope

GEORGIA TECH RES INST

Method and apparatus for the actuation of the cantilever of a probe-based instrument

DOW CHEMICAL CO

Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging

PRATER CRAIG

Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection

SU CHANMIN

Method and apparatus for obtaining quantitative measurements using a probe based instrument

VEECO METROLOGY INC

Method and apparatus of automatic scanning probe imaging