P

Inventor

CHEN KUAN-JUNG

TW26 patents
⚠️ This page may combine multiple inventors who share the name “CHEN KUAN-JUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

17 patents
US11688666B2Jun 27, 2023

Structures and methods for reducing process charging damages

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US11508628B2Nov 22, 2022

Method for forming a crystalline protective polysilicon layer

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US11031320B2Jun 8, 2021

Structures and methods for reducing process charging damages

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US12020933B2Jun 25, 2024

Trench etching process for photoresist line roughness improvement

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11955484B2Apr 9, 2024

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11527406B2Dec 13, 2022

Trench etching process for photoresist line roughness improvement

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US11404413B2Aug 2, 2022

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12068227B2Aug 20, 2024

Structures and methods for reducing process charging damages

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11935795B2Mar 19, 2024

Method for forming a crystalline protective polysilicon layer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12563826B2Feb 24, 2026

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12463035B2Nov 4, 2025

Trench etching process for photoresist line roughness improvement

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12074169B2Aug 27, 2024

Structures and methods for trench isolation

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11894381B2Feb 6, 2024

Structures and methods for trench isolation

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11271111B2Mar 8, 2022

Source/drain structure with barrier in FinFET device and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11145760B2Oct 12, 2021

Structure having improved fin critical dimension control

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12033951B2Jul 9, 2024

Alignment mark structure and method for making

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US12211910B2Jan 28, 2025

Bipolar junction transistor (BJT) and fabricating method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51

TSAI CHIH-HAO

2 patents

UNIV NATIONAL CHIAO TUNG

1 patent

BRILLIANT SENSING TECH

1 patent

PINE CASTLE INVESTMENTS LTD

1 patent

CHUNGHWA PICTURE TUBES LTD

1 patent

UNIV ISHOU

1 patent

AKUBIC CAYMAN LTD

1 patent

NYQUEST CORPORATION LTD

1 patent