Inventor
KIM KWANG SIK
KR28 patents
⚠️ This page may combine multiple inventors who share the name “KIM KWANG SIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LG ELECTRONICS INC
6 patentsUS11926951B2Mar 12, 2024
Apparatus for controlling motor and method for controlling motor
LG ELECTRONICS INC0 citations62
US11821131B2Nov 21, 2023
Clothes treating apparatus and the control method for the same
LG ELECTRONICS INC0 citations59
US11736046B2Aug 22, 2023
Apparatus for controlling motor and method for controlling motor
LG ELECTRONICS INC0 citations59
US11165373B2Nov 2, 2021
Motor driving apparatus
LG ELECTRONICS INC0 citations51
US11863094B2Jan 2, 2024
Apparatus for controlling motor and method for controlling motor
LG ELECTRONICS INC0 citations49
US11784601B2Oct 10, 2023
Apparatus for controlling motor and method for controlling motor
LG ELECTRONICS INC0 citations49
KIM KWANG SIK
4 patentsUS5219870AJun 15, 1993
Omeprazole compositions designed for administration in rectum
KIM KWANG SIK132 citations96
US7445064B2Nov 4, 2008
Vehicle using wind force
KIM KWANG SIK44 citations91
US8125098B2Feb 28, 2012
Wind power generation
KIM KWANG SIK2 citations60
US8980917B2Mar 17, 2015
Methods for treating or preventing brain infections
KIM KWANG SIK0 citations51
MOLEX LLC
3 patentsUS11404807B2Aug 2, 2022
Receptacle connector and connector assembly including the same
MOLEX LLC7 citations81
US10868378B2Dec 15, 2020
Receptacle connector and connector assembly including the same
MOLEX LLC7 citations80
US11967783B2Apr 23, 2024
Receptacle connector and connector assembly including the same
MOLEX LLC0 citations58
SAMSUNG ELECTRONICS CO LTD
3 patentsUS7091485B2Aug 15, 2006
Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles
SAMSUNG ELECTRONICS CO LTD6 citations72
US7468512B2Dec 23, 2008
Computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles
SAMSUNG ELECTRONICS CO LTD1 citations61
US7923684B2Apr 12, 2011
Methods, systems and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles
SAMSUNG ELECTRONICS CO LTD0 citations51