Inventor
BHOWMICK RANADEEP
US17 patents
⚠️ This page may combine multiple inventors who share the name “BHOWMICK RANADEEP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LAM RES CORP
15 patentsUS10504744B1Dec 10, 2019
Three or more states for achieving high aspect ratio dielectric etch
LAM RES CORP25 citations93
US11335539B2May 17, 2022
Systems and methods for optimizing power delivery to an electrode of a plasma chamber
LAM RES CORP6 citations85
US12387909B2Aug 12, 2025
Low frequency RF generator and associated electrostatic chuck
LAM RES CORP3 citations73
US11908660B2Feb 20, 2024
Systems and methods for optimizing power delivery to an electrode of a plasma chamber
LAM RES CORP2 citations73
US10861708B2Dec 8, 2020
Three or more states for achieving high aspect ratio dielectric etch
LAM RES CORP4 citations72
US12308211B2May 20, 2025
Systems and methods for use of low frequency harmonics in bias radiofrequency supply to control uniformity of plasma process results across substrate
LAM RES CORP1 citations64
US12354840B2Jul 8, 2025
Systems and methods for optimizing power delivery to an electrode of a plasma chamber
LAM RES CORP0 citations62
US12255052B2Mar 18, 2025
Process control for ion energy delivery using multiple generators and phase control
LAM RES CORP0 citations62
US12131886B2Oct 29, 2024
Systems and methods for extracting process control information from radiofrequency supply system of plasma processing system
LAM RES CORP1 citations62
US12080518B2Sep 3, 2024
Impedance match with an elongated RF strap
LAM RES CORP1 citations62
US12362159B2Jul 15, 2025
Systems and methods for controlling a plasma sheath characteristic
LAM RES CORP0 citations60
US12476082B2Nov 18, 2025
Radiofrequency signal filter arrangement for plasma processing system
LAM RES CORP0 citations52
US12266505B2Apr 1, 2025
Systems and methods for using binning to increase power during a low frequency cycle
LAM RES CORP0 citations52
US9257300B2Feb 9, 2016
Fluorocarbon based aspect-ratio independent etching
LAM RES CORP1 citations51
US10366869B2Jul 30, 2019
Active feedback control of subsystems of a process module
LAM RES CORP0 citations36