Inventor

IWANISHI NOBUFUSA

JP15 patents

⚠️ This page may combine multiple inventors who share the name “IWANISHI NOBUFUSA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

13 patents

US7107557B2Sep 12, 2006

Method for calculation of cell delay time and method for layout optimization of semiconductor integrated circuit

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD20 citations92

US6718529B1Apr 6, 2004

Method for calculation of cell delay time

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD27 citations92

US6629299B1Sep 30, 2003

Delay library representation method, delay library generation method and delay calculation method using the delay library

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD23 citations92

US6396307B1May 28, 2002

Semiconductor integrated circuit and method for designing the same

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD23 citations92

US6047247AApr 4, 2000

Method of estimating degradation with consideration of hot carrier effects

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD47 citations92

US7225418B2May 29, 2007

Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the same

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD25 citations90

US6278964B1Aug 21, 2001

Hot carrier effect simulation for integrated circuits

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD40 citations90

US6498515B2Dec 24, 2002

Semiconductor integrated circuit and method for designing the same

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD15 citations84

US6038397AMar 14, 2000

System for allocating the memory area of second data which value need not be preserved to another data of some of the processes

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD20 citations84

US6795802B2Sep 21, 2004

Apparatus and method for calculating temporal deterioration margin amount of LSI, and LSI inspection method

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD18 citations83

US6988254B2Jan 17, 2006

Method for designing semiconductor integrated circuit

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD17 citations82

US6938233B2Aug 30, 2005

Method and apparatus for designing semiconductor integrated circuit device based on voltage drop distribution

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD12 citations82

US5761081AJun 2, 1998

Method of evaluating signal propagation delay in logic integrated circuit

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD8 citations72

PANASONIC CORP

2 patents

US7831949B2Nov 9, 2010

Method of designing semiconductor integrated circuit, designing apparatus, semiconductor integrated circuit system, semiconductor integrated circuit mounting substrate, package and semiconductor integrated circuit

PANASONIC CORP9 citations82

US7925998B2Apr 12, 2011

Delay calculating method in semiconductor integrated circuit

PANASONIC CORP2 citations59