Inventor
TSURUKI YASUTAKA
JP7 patents
Patents
7 patentsUS6791389B2Sep 14, 2004
Variable delay circuit and a testing apparatus for a semiconductor circuit
ADVANTEST CORP17 citations82
US6768360B2Jul 27, 2004
Timing signal generation circuit and semiconductor test device with the same
ADVANTEST CORP15 citations82
US7187192B2Mar 6, 2007
Semiconductor test device having clock recovery circuit
ADVANTEST CORP13 citations81
US6956395B2Oct 18, 2005
Tester for testing an electronic device using oscillator and frequency divider
ADVANTEST CORP13 citations81
US5886536AMar 23, 1999
Semiconductor tester synchronized with external clock
ADVANTEST CORP12 citations71
US5761100AJun 2, 1998
Period generator for semiconductor testing apparatus
ADVANTEST CORP5 citations62
US7461314B2Dec 2, 2008
Test device
ADVANTEST CORP3 citations61