Inventor
NAKAMURA KUNIYASU
JP16 patents
⚠️ This page may combine multiple inventors who share the name “NAKAMURA KUNIYASU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
7 patentsUS6875984B2Apr 5, 2005
Bio electron microscope and observation method of specimen
HITACHI LTD105 citations98
US6531697B1Mar 11, 2003
Method and apparatus for scanning transmission electron microscopy
HITACHI LTD59 citations96
US6051834AApr 18, 2000
Electron microscope
HITACHI LTD65 citations96
US5866905AFeb 2, 1999
Electron microscope
HITACHI LTD74 citations96
US6822233B2Nov 23, 2004
Method and apparatus for scanning transmission electron microscopy
HITACHI LTD31 citations92
US6750451B2Jun 15, 2004
Observation apparatus and observation method using an electron beam
HITACHI LTD32 citations92
US6548811B1Apr 15, 2003
Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope
HITACHI LTD34 citations92
HITACHI HIGH TECH CORP
5 patentsUS7372029B2May 13, 2008
Scanning transmission electron microscope and scanning transmission electron microscopy
HITACHI HIGH TECH CORP15 citations92
US7285776B2Oct 23, 2007
Scanning transmission electron microscope and electron energy loss spectroscopy
HITACHI HIGH TECH CORP10 citations84
USD571385SJun 17, 2008
Electron microscope
HITACHI HIGH TECH CORP11 citations80
US7227144B2Jun 5, 2007
Scanning transmission electron microscope and scanning transmission electron microscopy
HITACHI HIGH TECH CORP7 citations73
US11756764B2Sep 12, 2023
Charged particle beam apparatus and method of controlling charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations48