Inventor

WANG LYNN T

US4 patents

⚠️ This page may combine multiple inventors who share the name “WANG LYNN T”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WANG LYNN T

2 patents

US8516407B1Aug 20, 2013

Methods for quantitatively evaluating the quality of double patterning technology-compliant layouts

WANG LYNN T9 citations80

US8418105B1Apr 9, 2013

Methods for pattern matching in a double patterning technology-compliant physical design flow

WANG LYNN T13 citations80

ZOU YI

1 patent

US8555215B2Oct 8, 2013

Methods for decomposing circuit design layouts and for fabricating semiconductor devices using decomposed patterns

ZOU YI8 citations79

GLOBALFOUNDRIES INC

1 patent

US8910090B2Dec 9, 2014

Methods involving pattern matching to identify and resolve potential non-double-patterning-compliant patterns in double patterning applications

GLOBALFOUNDRIES INC1 citations50