Inventor
CHENG YING-CHOU
TW25 patents
⚠️ This page may combine multiple inventors who share the name “CHENG YING-CHOU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
8 patentsUS8001494B2Aug 16, 2011
Table-based DFM for accurate post-layout analysis
TAIWAN SEMICONDUCTOR MFG16 citations92
US7783999B2Aug 24, 2010
Electrical parameter extraction for integrated circuit design
TAIWAN SEMICONDUCTOR MFG23 citations92
US8037575B2Oct 18, 2011
Method for shape and timing equivalent dimension extraction
TAIWAN SEMICONDUCTOR MFG17 citations83
US8372742B2Feb 12, 2013
Method, system, and apparatus for adjusting local and global pattern density of an integrated circuit design
TAIWAN SEMICONDUCTOR MFG14 citations82
US8910092B1Dec 9, 2014
Model based simulation method with fast bias contour for lithography process check
TAIWAN SEMICONDUCTOR MFG6 citations71
US9026957B2May 5, 2015
Method of defining an intensity selective exposure photomask
TAIWAN SEMICONDUCTOR MFG1 citations62
US9189587B2Nov 17, 2015
Chip level critical point analysis with manufacturer specific data
TAIWAN SEMICONDUCTOR MFG1 citations51
US9159577B2Oct 13, 2015
Method of forming substrate pattern
TAIWAN SEMICONDUCTOR MFG0 citations50
TAIWAN SEMICONDUCTOR MFG CO LTD
7 patentsUS9404743B2Aug 2, 2016
Method for validating measurement data
TAIWAN SEMICONDUCTOR MFG CO LTD62 citations95
US8952329B1Feb 10, 2015
3D image profiling techniques for lithography
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations70
US11353324B2Jun 7, 2022
Method for validating measurement data
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US9983473B2May 29, 2018
Photomask and method for fabricating integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9612526B2Apr 4, 2017
Photomask and method for fabricating integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations51
US10520303B2Dec 31, 2019
Method for validating measurement data
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9823066B2Nov 21, 2017
Method for validating measurement data
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
CHENG YING-CHOU
5 patentsUS8527918B2Sep 3, 2013
Target-based thermal design using dummy insertion for semiconductor devices
CHENG YING-CHOU11 citations83
US8332797B2Dec 11, 2012
Parameterized dummy cell insertion for process enhancement
CHENG YING-CHOU8 citations83
US8745554B2Jun 3, 2014
Practical approach to layout migration
CHENG YING-CHOU8 citations82
US8219951B2Jul 10, 2012
Method of thermal density optimization for device and process enhancement
CHENG YING-CHOU5 citations61
US8806386B2Aug 12, 2014
Customized patterning modulation and optimization
CHENG YING-CHOU0 citations50