P

Inventor

HUNG Min-Hsiu

TW30 patents
⚠️ This page may combine multiple inventors who share the name “HUNG Min-Hsiu”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

29 patents
US9899258B1Feb 20, 2018

Metal liner overhang reduction and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD20 citations93
US11107690B2Aug 31, 2021

Fin field-effect transistor device and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US10847411B2Nov 24, 2020

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD12 citations84
US10685842B2Jun 16, 2020

Selective formation of titanium silicide and titanium nitride by hydrogen gas control

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations83
US11232945B2Jan 25, 2022

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11901183B2Feb 13, 2024

Fin field-effect transistor device and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11295956B2Apr 5, 2022

Selective formation of titanium silicide and titanium nitride by hydrogen gas control

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US10658234B2May 19, 2020

Formation method of interconnection structure of semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US11929314B2Mar 12, 2024

Interconnect structures including a fin structure and a metal cap

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11011611B2May 18, 2021

Semiconductor device with low resistivity contact structure

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12557568B2Feb 17, 2026

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12400853B2Aug 26, 2025

Method of forming conductive feature including cleaning step

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12087575B2Sep 10, 2024

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11955329B2Apr 9, 2024

Method of forming conductive feature including cleaning step

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11670499B2Jun 6, 2023

Method of forming conductive feature including cleaning step

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12512324B2Dec 30, 2025

Selective formation of titanium silicide and titanium nitride by hydrogen gas control

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12394625B2Aug 19, 2025

Fin field-effect transistor device and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11972951B2Apr 30, 2024

Selective formation of titanium silicide and titanium nitride by hydrogen gas control

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11532503B2Dec 20, 2022

Conductive feature structure including a blocking region

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12538771B2Jan 27, 2026

Barrier layer for an interconnect structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12308292B2May 20, 2025

Methods of forming semiconductor device structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12237218B2Feb 25, 2025

Method of fabricating contact structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11222818B2Jan 11, 2022

Formation method of semiconductor device structure with metal-semiconductor compound region

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12272600B2Apr 8, 2025

Contact features of semiconductor device and method of forming same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US10804097B2Oct 13, 2020

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10714334B2Jul 14, 2020

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US11444173B2Sep 13, 2022

Semiconductor device structure with salicide layer and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10804140B2Oct 13, 2020

Interconnect formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10700177B2Jun 30, 2020

Semiconductor device with low resistivity contact structure and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50

TAIWAN SEMICONDUCTOR MFG COMPANY LTD

1 patent