Inventor
COWLEY ANDREW P
US15 patents
⚠️ This page may combine multiple inventors who share the name “COWLEY ANDREW P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
13 patentsUS7397260B2Jul 8, 2008
Structure and method for monitoring stress-induced degradation of conductive interconnects
IBM169 citations98
US6278147B1Aug 21, 2001
On-chip decoupling capacitor with bottom hardmask
IBM19 citations92
US7598616B2Oct 6, 2009
Interconnect structure
IBM11 citations83
US7335588B2Feb 26, 2008
Interconnect structure and method of fabrication of same
IBM12 citations83
US7830019B2Nov 9, 2010
Via bottom contact and method of manufacturing same
IBM7 citations73
US6387754B2May 14, 2002
Method of forming an on-chip decoupling capacitor with bottom hardmask
IBM8 citations73
US8053257B2Nov 8, 2011
Method for prediction of premature dielectric breakdown in a semiconductor
IBM5 citations62
US7639032B2Dec 29, 2009
Structure for monitoring stress-induced degradation of conductive interconnects
IBM2 citations62
US7585764B2Sep 8, 2009
VIA bottom contact and method of manufacturing same
IBM2 citations62
US7563710B2Jul 21, 2009
Method of fabrication of interconnect structures
IBM1 citations62
US7528493B2May 5, 2009
Interconnect structure and method of fabrication of same
IBM2 citations62
US7494915B2Feb 24, 2009
Back end interconnect with a shaped interface
IBM0 citations52
US7692439B2Apr 6, 2010
Structure for modeling stress-induced degradation of conductive interconnects
IBM0 citations51