Inventor
CHANG TZU-YUN
TW18 patents
⚠️ This page may combine multiple inventors who share the name “CHANG TZU-YUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
17 patentsUS9406771B1Aug 2, 2016
Semiconductor structure and manufacturing method thereof
UNITED MICROELECTRONICS CORP10 citations83
US9923028B1Mar 20, 2018
Resistive memory and method for manufacturing the same
UNITED MICROELECTRONICS CORP4 citations70
US10312250B1Jun 4, 2019
Semiconductor device and manufacturing method thereof
UNITED MICROELECTRONICS CORP4 citations68
US7135365B2Nov 14, 2006
Method of manufacturing MOS transistors
UNITED MICROELECTRONICS CORP5 citations62
US12573458B2Mar 10, 2026
Method for forming semiconductor structure with wave shaped erase gate
UNITED MICROELECTRONICS CORP0 citations59
US12315571B2May 27, 2025
Semiconductor structure with wave shaped erase gate and forming method thereof
UNITED MICROELECTRONICS CORP0 citations59
US12272397B2Apr 8, 2025
Forming operation method of resistive random access memory
UNITED MICROELECTRONICS CORP0 citations59
US12082405B2Sep 3, 2024
Programmable memory and forming method thereof
UNITED MICROELECTRONICS CORP0 citations59
US11832444B2Nov 28, 2023
Method for forming programmable memory
UNITED MICROELECTRONICS CORP0 citations59
US11706915B2Jul 18, 2023
Programmable memory and forming method thereof
UNITED MICROELECTRONICS CORP0 citations59
US11508783B2Nov 22, 2022
Method for fabricating memory device
UNITED MICROELECTRONICS CORP0 citations58
US11024672B2Jun 1, 2021
Structure of memory device and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations58
US11706933B2Jul 18, 2023
Semiconductor memory device and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations57
US7714396B2May 11, 2010
Metal-oxide semiconductor field effect transistor
UNITED MICROELECTRONICS CORP1 citations51
US10074692B2Sep 11, 2018
Resistive memory and method for manufacturing the same
UNITED MICROELECTRONICS CORP1 citations49
US9691671B2Jun 27, 2017
Test key array
UNITED MICROELECTRONICS CORP1 citations45
US10770565B2Sep 8, 2020
Memory structure and manufacturing method thereof
UNITED MICROELECTRONICS CORP0 citations39