P

Inventor

CHANG TZU-YUN

TW18 patents
⚠️ This page may combine multiple inventors who share the name “CHANG TZU-YUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

17 patents
US9406771B1Aug 2, 2016

Semiconductor structure and manufacturing method thereof

UNITED MICROELECTRONICS CORP10 citations83
US9923028B1Mar 20, 2018

Resistive memory and method for manufacturing the same

UNITED MICROELECTRONICS CORP4 citations70
US10312250B1Jun 4, 2019

Semiconductor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP4 citations68
US7135365B2Nov 14, 2006

Method of manufacturing MOS transistors

UNITED MICROELECTRONICS CORP5 citations62
US12573458B2Mar 10, 2026

Method for forming semiconductor structure with wave shaped erase gate

UNITED MICROELECTRONICS CORP0 citations59
US12315571B2May 27, 2025

Semiconductor structure with wave shaped erase gate and forming method thereof

UNITED MICROELECTRONICS CORP0 citations59
US12272397B2Apr 8, 2025

Forming operation method of resistive random access memory

UNITED MICROELECTRONICS CORP0 citations59
US12082405B2Sep 3, 2024

Programmable memory and forming method thereof

UNITED MICROELECTRONICS CORP0 citations59
US11832444B2Nov 28, 2023

Method for forming programmable memory

UNITED MICROELECTRONICS CORP0 citations59
US11706915B2Jul 18, 2023

Programmable memory and forming method thereof

UNITED MICROELECTRONICS CORP0 citations59
US11508783B2Nov 22, 2022

Method for fabricating memory device

UNITED MICROELECTRONICS CORP0 citations58
US11024672B2Jun 1, 2021

Structure of memory device and fabrication method thereof

UNITED MICROELECTRONICS CORP0 citations58
US11706933B2Jul 18, 2023

Semiconductor memory device and fabrication method thereof

UNITED MICROELECTRONICS CORP0 citations57
US7714396B2May 11, 2010

Metal-oxide semiconductor field effect transistor

UNITED MICROELECTRONICS CORP1 citations51
US10074692B2Sep 11, 2018

Resistive memory and method for manufacturing the same

UNITED MICROELECTRONICS CORP1 citations49
US9691671B2Jun 27, 2017

Test key array

UNITED MICROELECTRONICS CORP1 citations45
US10770565B2Sep 8, 2020

Memory structure and manufacturing method thereof

UNITED MICROELECTRONICS CORP0 citations39

CHANG TZU-YUN

1 patent