Inventor

YANG JI-WEN

CN2 patents

Patents

2 patents

US7779550B2Aug 24, 2010

Micrometer-based measuring system and method of using same

SHENZHEN FUTAIHONG PREC IND CO5 citations60

US7984561B2Jul 26, 2011

Device for determining dimension of a workpiece

SHENZHEN FUTAIHONG PREC IND CO4 citations59