Inventor

COHEN BOAZ

IL31 patents

⚠️ This page may combine multiple inventors who share the name “COHEN BOAZ”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

COHEN BOAZ

APPLIED MATERIALS ISRAEL LTD

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of generating a training set usable for examination of a semiconductor specimen and system thereof

System, method and computer program product for classifying a multiplicity of items

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

Generating a training set usable for examination of a semiconductor specimen

Method of deep learning-based examination of a semiconductor specimen and system thereof

System and method for patch based inspection

Detecting defects in semiconductor specimens using weak labeling

Determining a critical dimension variation of a pattern

Determination of defect location for examination of a specimen

Method of classifying defects in a semiconductor specimen and system thereof

Machine learning-based defect detection of a specimen

Automatic selection of algorithmic modules for examination of a specimen

Mask inspection of a semiconductor specimen

Detecting defects in semiconductor specimens using weak labeling

Determining a critical dimension variation of a pattern

Method of deep learning-based examination of a semiconductor specimen and system thereof

Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interest

Selecting a coreset of potential defects for estimating expected defects of interest

Mask inspection of a semiconductor specimen

System and methods of generating comparable regions of a lithographic mask

Method of classifying defects in a semiconductor specimen and system thereof

System, method and computer program product for classifying defects

Machine learning-based classification of defects in a semiconductor specimen

Method of classifying defects in a specimen semiconductor examination and system thereof

Guided inspection of a semiconductor wafer based on systematic defects

System and method for printability based inspection

Defect offset correction for examination of semiconductor specimens

Defect examination on a semiconductor specimen

BRILL ALON

Enclosure protecting system and method