Inventor
STONE STACEY
US25 patents
⚠️ This page may combine multiple inventors who share the name “STONE STACEY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FEI CO
19 patentsUS8912490B2Dec 16, 2014
Method for preparing samples for imaging
FEI CO20 citations91
US9601313B2Mar 21, 2017
Automated TEM sample preparation
FEI CO14 citations90
US9741536B2Aug 22, 2017
High aspect ratio structure analysis
FEI CO7 citations84
US9412560B2Aug 9, 2016
Bulk deposition for tilted mill protection
FEI CO7 citations84
US8822921B2Sep 2, 2014
Method for preparing samples for imaging
FEI CO11 citations83
US8729469B1May 20, 2014
Multiple sample attachment to nano manipulator for high throughput sample preparation
FEI CO18 citations83
US9111720B2Aug 18, 2015
Method for preparing samples for imaging
FEI CO7 citations82
US9653260B2May 16, 2017
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella
FEI CO7 citations79
US9279752B2Mar 8, 2016
Method for preparing thin samples for TEM imaging
FEI CO4 citations73
US10825651B2Nov 3, 2020
Automated TEM sample preparation
FEI CO1 citations71
US10340119B2Jul 2, 2019
Automated TEM sample preparation
FEI CO2 citations71
US10026590B2Jul 17, 2018
Fiducial design for tilted or glancing mill operations with a charged particle beam
FEI CO3 citations71
US9488554B2Nov 8, 2016
Method and system for reducing curtaining in charged particle beam sample preparation
FEI CO4 citations71
US9006651B2Apr 14, 2015
Method for creating S/TEM sample and sample structure
FEI CO2 citations62
US11315756B2Apr 26, 2022
Fiducial design for tilted or glancing mill operations with a charged particle beam
FEI CO0 citations61
US9384982B2Jul 5, 2016
Depositing material into high aspect ratio structures
FEI CO0 citations52
US9336985B2May 10, 2016
Method for creating S/TEM sample and sample structure
FEI CO0 citations52
US9696372B2Jul 4, 2017
Multidimensional structural access
FEI CO1 citations51
US10283317B2May 7, 2019
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella
FEI CO0 citations46
BLACKWOOD JEFF
5 patentsUS8134124B2Mar 13, 2012
Method for creating S/tem sample and sample structure
BLACKWOOD JEFF42 citations96
US8536525B2Sep 17, 2013
Method for creating S/TEM sample and sample structure
BLACKWOOD JEFF16 citations91
US8525137B2Sep 3, 2013
Method for creating S/TEM sample and sample structure
BLACKWOOD JEFF13 citations91
US9263306B2Feb 16, 2016
Protective layer for charged particle beam processing
BLACKWOOD JEFF0 citations51
US8097308B2Jan 17, 2012
Protective layer for charged particle beam processing
BLACKWOOD JEFF1 citations51