P

Inventor

XU KUN

US136 patents
⚠️ This page may combine multiple inventors who share the name “XU KUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

17 patents
US9281253B2Mar 8, 2016

Determination of gain for eddy current sensor

APPLIED MATERIALS INC28 citations94
US11524382B2Dec 13, 2022

Polishing apparatus using machine learning and compensation for pad thickness

APPLIED MATERIALS INC8 citations86
US10994389B2May 4, 2021

Polishing apparatus using neural network for monitoring

APPLIED MATERIALS INC11 citations85
US9636797B2May 2, 2017

Adjusting eddy current measurements

APPLIED MATERIALS INC11 citations84
US9205527B2Dec 8, 2015

In-situ monitoring system with monitoring of elongated region

APPLIED MATERIALS INC7 citations84
US7815495B2Oct 19, 2010

Pad conditioner

APPLIED MATERIALS INC10 citations84
US10391610B2Aug 27, 2019

Core configuration for in-situ electromagnetic induction monitoring system

APPLIED MATERIALS INC6 citations83
US12320883B2Jun 3, 2025

Resistivity-based adjustment of thresholds for in-situ monitoring

APPLIED MATERIALS INC1 citations74
US11780047B2Oct 10, 2023

Determination of substrate layer thickness with polishing pad wear compensation

APPLIED MATERIALS INC4 citations74
US11199605B2Dec 14, 2021

Resistivity-based adjustment of measurements from in-situ monitoring

APPLIED MATERIALS INC1 citations73
US11079459B2Aug 3, 2021

Resistivity-based calibration of in-situ electromagnetic inductive monitoring

APPLIED MATERIALS INC1 citations73
US10562148B2Feb 18, 2020

Real time profile control for chemical mechanical polishing

APPLIED MATERIALS INC6 citations73
US10556315B2Feb 11, 2020

Determination of gain for eddy current sensor

APPLIED MATERIALS INC1 citations73
US11865664B2Jan 9, 2024

Profile control with multiple instances of contol algorithm during polishing

APPLIED MATERIALS INC1 citations72
US11850699B2Dec 26, 2023

Switching control algorithms on detection of exposure of underlying layer during polishing

APPLIED MATERIALS INC1 citations72
US11658078B2May 23, 2023

Using a trained neural network for use in in-situ monitoring during polishing and polishing system

APPLIED MATERIALS INC1 citations72
US11638982B2May 2, 2023

Core configuration for in-situ electromagnetic induction monitoring system

APPLIED MATERIALS INC1 citations72

AMAZON TECH INC

12 patents

XU KUN

7 patents

IBM

3 patents

ICONTROL NETWORKS INC

2 patents

FREESCALE SEMICONDUCTOR INC

1 patent

TENCENT TECH SHENZHEN CO LTD

1 patent

MA WENJIN

1 patent

IRAVANI HASSAN G

1 patent

Tencent America LLC

1 patent

JOKINEN TOMMI M

1 patent

QINGDAO HISENSE HITACHI AIR CONDITIONING SYS CO LTD

1 patent

UNIV JIANGSU

1 patent

MARVELL INT LTD

1 patent

Showing the top 50 of 136 patents by PatentIndex Score.