P

Inventor

TOMITA TAKESHI

JP15 patents
⚠️ This page may combine multiple inventors who share the name “TOMITA TAKESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JEOL LTD

6 patents
US6759656B2Jul 6, 2004

Electron microscope equipped with electron biprism

JEOL LTD24 citations92
US4814716AMar 21, 1989

Apparatus for producing and accelerating an electron beam

JEOL LTD18 citations73
US5811806ASep 22, 1998

Electron-beam biprism

JEOL LTD11 citations71
US4633085ADec 30, 1986

Transmission-type electron microscope

JEOL LTD13 citations71
US4626689ADec 2, 1986

Electron beam focusing system for electron microscope

JEOL LTD14 citations69
US5763889AJun 9, 1998

Electron beam-generating apparatus

JEOL LTD2 citations62

AISIN AW CO

3 patents
US7586304B2Sep 8, 2009

Stator position measuring method and measuring device

AISIN AW CO7 citations73
US7866027B2Jan 11, 2011

Motor driving device manufacturing method

AISIN AW CO4 citations62
US7508151B2Mar 24, 2009

Stator position adjustment method and device

AISIN AW CO6 citations62

MITSUBISHI GAS CHEMICAL CO

2 patents
US5399334AMar 21, 1995

Process for producing hydrogen peroxide

MITSUBISHI GAS CHEMICAL CO36 citations92
US5378450AJan 3, 1995

Process for producing hydrogen peroxide

MITSUBISHI GAS CHEMICAL CO42 citations91

OMRON TATEISI ELECTRONICS CO

1 patent
US6132818AOct 17, 2000

Method of marking with laser beam

OMRON TATEISI ELECTRONICS CO31 citations89

RIKEN

1 patent
US12463007B2Nov 4, 2025

Electron microscope analysis system

RIKEN0 citations59

SUMITOMO HEAVY INDUSTRIES

1 patent
US4459275AJul 10, 1984

Process for production of sulfur from SO2 -containing gas

SUMITOMO HEAVY INDUSTRIES6 citations59

TOMITA TAKESHI

1 patent
US8158940B2Apr 17, 2012

Magnetic domain imaging system

TOMITA TAKESHI1 citations45