Inventor
HABERSETZER DARYL L
US38 patents
Patents
38 patentsUS5677567AOct 14, 1997
Leads between chips assembly
MICRON TECHNOLOGY INC93 citations97
US6130834AOct 10, 2000
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC53 citations96
US6028799AFeb 22, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC17 citations96
US5894165AApr 13, 1999
Leads between chips assembly
MICRON TECHNOLOGY INC45 citations96
US5770480AJun 23, 1998
Method of leads between chips assembly
MICRON TECHNOLOGY INC35 citations96
US5627478AMay 6, 1997
Apparatus for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC59 citations96
US6834022B2Dec 21, 2004
Partial array self-refresh
MICRON TECHNOLOGY INC42 citations92
US6255837B1Jul 3, 2001
Apparatus and method disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC18 citations92
US6055173AApr 25, 2000
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC19 citations92
US5808897ASep 15, 1998
Integrated circuit device having interchangeable terminal connection
MICRON TECHNOLOGY INC30 citations92
US5721703AFeb 24, 1998
Reprogrammable option select circuit
MICRON TECHNOLOGY INC22 citations92
US5689455ANov 18, 1997
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC29 citations92
US5877993AMar 2, 1999
Memory circuit voltage regulator
MICRON TECHNOLOGY INC16 citations86
US6903991B2Jun 7, 2005
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC12 citations84
US6826071B2Nov 30, 2004
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC14 citations84
US6650587B2Nov 18, 2003
Partial array self-refresh
MICRON TECHNOLOGY INC14 citations84
US6778452B2Aug 17, 2004
Circuit and method for voltage regulation in a semiconductor device
MICRON TECHNOLOGY INC6 citations82
US6570400B2May 27, 2003
Method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC11 citations82
US6160413ADec 12, 2000
Apparatus and method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC12 citations82
US6052322AApr 18, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC6 citations82
US6011731AJan 4, 2000
Cell plate regulator
MICRON TECHNOLOGY INC7 citations82
US6181617B1Jan 30, 2001
Method and apparatus for testing a semiconductor device
MICRON TECHNOLOGY INC2 citations74
US5982687ANov 9, 1999
Method of detecting leakage within a memory cell capacitor
MICRON TECHNOLOGY INC3 citations74
US6661693B2Dec 9, 2003
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC7 citations73
US6646459B2Nov 11, 2003
Method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC6 citations73
US6590407B2Jul 8, 2003
Apparatus for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC6 citations73
US6445605B1Sep 3, 2002
Circuit for programming antifuse bits
MICRON TECHNOLOGY INC13 citations73
US6255838B1Jul 3, 2001
Apparatus and method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC9 citations73
US6882587B2Apr 19, 2005
Method of preparing to test a capacitor
MICRON TECHNOLOGY INC0 citations63
US6600687B2Jul 29, 2003
Method of compensating for a defect within a semiconductor device
MICRON TECHNOLOGY INC0 citations63
US6469944B2Oct 22, 2002
Method of compensating for a defect within a semiconductor device
MICRON TECHNOLOGY INC0 citations63
US6445629B2Sep 3, 2002
Method of stressing a memory device
MICRON TECHNOLOGY INC0 citations63
US6418071B2Jul 9, 2002
Method of testing a memory cell
MICRON TECHNOLOGY INC0 citations63
US6353564B1Mar 5, 2002
Method of testing a memory array
MICRON TECHNOLOGY INC0 citations63
US6226210B1May 1, 2001
Method of detecting a short from a digit line pair to ground
MICRON TECHNOLOGY INC0 citations63
US6198676B1Mar 6, 2001
Test device
MICRON TECHNOLOGY INC0 citations63
US6188622B1Feb 13, 2001
Method of identifying a defect within a memory circuit
MICRON TECHNOLOGY INC1 citations63
US6026040AFeb 15, 2000
Method of altering the margin affecting a memory cell
MICRON TECHNOLOGY INC1 citations63