Inventor
GRAALUM JASON E
US7 patents
Patents
7 patentsUS5627478AMay 6, 1997
Apparatus for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC59 citations96
US6255837B1Jul 3, 2001
Apparatus and method disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC18 citations92
US6570400B2May 27, 2003
Method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC11 citations82
US6160413ADec 12, 2000
Apparatus and method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC12 citations82
US6646459B2Nov 11, 2003
Method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC6 citations73
US6590407B2Jul 8, 2003
Apparatus for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC6 citations73
US6255838B1Jul 3, 2001
Apparatus and method for disabling and re-enabling access to IC test functions
MICRON TECHNOLOGY INC9 citations73